Publications

Found 1602 results
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2014
Chung-Ta, HSU., C-Y. Huang, Y. Zhao, S-C. Haung, D. F. Feezell, S. P. DenBaars, S. Nakamura, and J. S. Speck, Pec etching of (20-2-1) semipolar gallium nitride for external efficiency enhancement in light emitting diode applications, 2014.
Hirai, A., Z. Jia, M. Saito, H. Yamada, K. Iso, S. P. DenBaars, S. Nakamura, and J. S. Speck, Planar nonpolar group-III nitride films grown on miscut substrates, 2014.
McSkimming, B. M., F. Wu, T. Huault, C. Chaix, and J. S. Speck, "Plasma assisted molecular beam epitaxy of GaN with growth rates> 2.6 μm/h", Journal of Crystal Growth, vol. 386: Elsevier, pp. 168–174, 2014.
Bierwagen, O., and J. S. Speck, "Plasma-assisted molecular beam epitaxy of Sn-doped In2O3: Sn incorporation, structural changes, doping limits, and compensation", physica status solidi (a), vol. 211, no. 1: Wiley Online Library, pp. 48–53, 2014.
Pimputkar, S., D. S. Kamber, J. S. Speck, and S. Nakamura, Reactor designs for use in ammonothermal growth of group-III nitride crystals, feb # " 4", 2014.
Pimputkar, S., D. Shane Kamber, J. S. Speck, and S. Nakamura, Reactor designs for use in ammonothermal growth of group-iii nitride crystals, 2014.
Keller, S., H. Li, M. Laurent, Y. Hu, N. Pfaff, J. Lu, D. F. Brown, N. A. Fichtenbaum, J. S. Speck, S. P. DenBaars, et al., "Recent progress in metal-organic chemical vapor deposition of N-polar group-III nitrides", Semiconductor Science and Technology, vol. 29, no. 11: IOP Publishing, pp. 113001, 2014.
Chen, J., E. Xia Zhang, C. Xuan Zhang, M. W. McCurdy, D. M. Fleetwood, R. D. Schrimpf, S. W. Kaun, E. C. H. Kyle, and J. S. Speck, "RF performance of proton-irradiated AlGaN/GaN HEMTs", IEEE Transactions on Nuclear Science, vol. 61, no. 6: IEEE, pp. 2959–2964, 2014.
von Wenckstern, H., D. Splith, F. Schmidt, M. Grundmann, O. Bierwagen, JS. Speck, and others, "Schottky contacts to In ${$sub 2$}$ O ${$sub 3$}$", APL Materials, vol. 2, no. 4, 2014.
von Wenckstern, H., D. Splith, F. Schmidt, M. Grundmann, O. Bierwagen, and J. S. Speck, "Schottky contacts to In2O3", APL Materials, vol. 2, no. 4: AIP, pp. 046104, 2014.
Wu, F., Y. Zhao, A. Romanov, S. P. DenBaars, S. Nakamura, and J. S. Speck, "Stacking faults and interface roughening in semipolar (20 2\= 1\=) single InGaN quantum wells for long wavelength emission", Applied Physics Letters, vol. 104, no. 15: AIP, pp. 151901, 2014.
Hardy, M. T., P. Shan Hsu, S. P. DenBaars, J. S. Speck, and S. Nakamura, Suppression of inclined defect formation and increase in critical thickness by silicon doping on non-c-plane (Al, Ga, In) N, 2014.
Perl, E. E., W. E. McMahon, R. M. Farrell, S. P. DenBaars, J. S. Speck, and J. E. Bowers, "Surface structured optical coatings with near-perfect broadband and wide-angle antireflective properties", Nano letters, vol. 14, no. 10: ACS Publications, pp. 5960–5964, 2014.
Okumura, H., M. Kita, K. Sasaki, A. Kuramata, M. Higashiwaki, and J. S. Speck, "Systematic investigation of the growth rate of β-Ga2O3 (010) by plasma-assisted molecular beam epitaxy", Applied Physics Express, vol. 7, no. 9: IOP Publishing, pp. 095501, 2014.
Jr, R. M. Farrell, T. J. Baker, A. Chakraborty, B. A. Haskell, M. P Pattison, R. Sharma, U. K. Mishra, S. P. DenBaars, J. S. Speck, S. Nakamura, et al., Technique for the growth and fabrication of semipolar (Ga, Al, In, B) N thin films, heterostructures, and devices, 2014.
Sasikumar, A., DW. Cardwell, AR. Arehart, J. Lu, SW. Kaun, S. Keller, UK. Mishra, JS. Speck, JP. Pelz, and SA. Ringel, "Toward a physical understanding of the reliability-limiting E C-0.57 eV trap in GaN HEMTs", Reliability Physics Symposium, 2014 IEEE International: IEEE, pp. 2C–1, 2014.
Korhonen, E., F. Tuomisto, O. Bierwagen, JS. Speck, ME. White, and Z. Galazka, "Vacancy complexes in Sb-doped SnO 2", AIP Conference Proceedings, vol. 1583, no. 1: AIP, pp. 368–371, 2014.
Prozheeva, V., F. Tuomisto, G. Koblmüller, J. S. Speck, A. Knübel, and R. Aidam, "Vacancy defect formation in PA-MBE grown C-doped InN", physica status solidi (c), vol. 11, no. 3-4: Wiley Online Library, pp. 530–532, 2014.
Zhao, Y., R. M. Farrell, Y-R. Wu, and J. S. Speck, "Valence band states and polarized optical emission from nonpolar and semipolar III–nitride quantum well optoelectronic devices", Japanese Journal of Applied Physics, vol. 53, no. 10: IOP Publishing, pp. 100206, 2014.
Farahani, SK. Vasheghani, TD. Veal, JJ. Mudd, DO. Scanlon, GW. Watson, O. Bierwagen, ME. White, JS. Speck, and CF. McConville, "Valence-band density of states and surface electron accumulation in epitaxial SnO 2 films", Physical Review B, vol. 90, no. 15: American Physical Society, pp. 155413, 2014.
2013
Mazumder, B., X. Liu, UK. Mishra, and JS. Speck, "3D Characterization Study of High-k Dielectric on GaN Using Atom Probe Tomography", Microscopy and Microanalysis, vol. 19, no. S2: Cambridge University Press, pp. 1026–1027, 2013.
Poblenz, C., J. S. Speck, and D. S. Kamber, Ammonothermal method for growth of bulk gallium nitride, 2013.
Pimputkar, S., P. Von Dollen, S. Nakamura, and J. S. Speck, Apparatus used for the growth of group-iii nitride crystals utilizing carbon fiber containing materials and group-iii nitride grown therewith, 2013.
Mazumder, B., S. W. Kaun, J. Lu, S. Keller, U. K. Mishra, and J. S. Speck, "Atom probe analysis of AlN interlayers in AlGaN/AlN/GaN heterostructures", Applied Physics Letters, vol. 102, no. 11: AIP, pp. 111603, 2013.
Mazumder, B., S. W. Kaun, J. Lu, S. Keller, U. K. Mishra, and J. S. Speck, "Atom probe characterization of an AlN interlayer within HEMT structures grown by molecular beam epitaxy and metal-organic chemical vapor deposition", Bulletin of the American Physical Society, vol. 58: American Physical Society, 2013.

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