Atom probe characterization of an AlN interlayer within HEMT structures grown by molecular beam epitaxy and metal-organic chemical vapor deposition

TitleAtom probe characterization of an AlN interlayer within HEMT structures grown by molecular beam epitaxy and metal-organic chemical vapor deposition
Publication TypeJournal Article
Year of Publication2013
AuthorsMazumder, B., S. W. Kaun, J. Lu, S. Keller, U. K. Mishra, and J. S. Speck
JournalBulletin of the American Physical Society
Volume58