| Title | 3D Characterization Study of High-k Dielectric on GaN Using Atom Probe Tomography |
| Publication Type | Journal Article |
| Year of Publication | 2013 |
| Authors | Mazumder, B., X. Liu, UK. Mishra, and JS. Speck |
| Journal | Microscopy and Microanalysis |
| Volume | 19 |
| Pagination | 1026–1027 |