| Title | Toward a physical understanding of the reliability-limiting E C-0.57 eV trap in GaN HEMTs |
| Publication Type | Conference Paper |
| Year of Publication | 2014 |
| Authors | Sasikumar, A., DW. Cardwell, AR. Arehart, J. Lu, SW. Kaun, S. Keller, UK. Mishra, JS. Speck, JP. Pelz, and SA. Ringel |
| Conference Name | Reliability Physics Symposium, 2014 IEEE International |
| Publisher | IEEE |