Publications
Organic polymeric thin-film transistors fabricated by selective dewetting." APPLIED PHYSICS LETTERS 81 (2002): 4260-4262.
"Polymer thin-film transistors with chemically modified dielectric interfaces." APPLIED PHYSICS LETTERS 81 (2002): 4383-4385.
"Bipolaron mechanism for bias-stress effects in polymer transistors." PHYSICAL REVIEW B 68 (2003): 085316.
"Fabrication of arrays of organic polymeric thin-film transistors using self-aligned microfluidic channels." ADVANCED MATERIALS 15 (2003): 1903+.
"Fabrication of arrays of polymeric transistors using microfluidics." ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 226 (2003): U393-U394.
"All jet-printed polymer thin film transistor active-matrix backplanes." ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 228 (2004): U767-U768.
"All jet-printed polymer thin-film transistor active-matrix backplanes." APPLIED PHYSICS LETTERS 85 (2004): 3304-3306.
"Localized state effects in polymer thin film transistors." JOURNAL OF NON-CRYSTALLINE SOLIDS 338 (2004): 607-611.
"Short channel effects in regioregular poly(thiophene) thin film transistors." JOURNAL OF APPLIED PHYSICS 96 (2004): 2063-2070.
"Polymer thin-film transistor arrays patterned by stamping." ADVANCED FUNCTIONAL MATERIALS 15 (2005): 1105-1110.
"Polymer transistor display backplanes: High performance inkjet printed devices." ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 229 (2005): U1128.
"Printed active-matrix TFT arrays for x-ray imaging." In Medical Imaging 2005: Physics of Medical Imaging, Pts 1 and 2, edited by MJ Flynn, 7-17. Vol. 5745. PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) 5745. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA: SPIE, 2005.
"Printed Organic Electronics." In FLEXIBLE FLAT PANEL DISPLAYS, edited by GP Crawford, 219-243. Wiley-SID Series in Display Technology. OSNEY MEAD, OXFORD OX2 0EL, ENGLAND: BLACKWELL SCIENCE PUBL, 2005.
"Printing methods and materials for large-area electronic devices." PROCEEDINGS OF THE IEEE 93 (2005): 1491-1499.
"Extended time bias stress effects in polymer transistors." JOURNAL OF APPLIED PHYSICS 100 (2006): 114518.
"Toolset for printed electronics." In Digital Fabrication 2006, Final Program and Proceedings, 17-20. 7003 KILWORTH LANE, SPRINGFIELD, VA 22151 USA: Soc Imaging Sci & Technol; Imaging Soc Japan, 2006.
"Bias stress effects in organic thin film transistors." In 2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL, 243+. International Reliability Physics Symposium. 345 E 47TH ST, NEW YORK, NY 10017 USA: IEEE, 2007.
"Chemical impurity effects on transport in polymer transistors." PHYSICAL REVIEW B 76 (2007): 045208.
"Digital lithographic processing for large-area electronics." JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY 15 (2007): 463-470.
"Effects of molecular oxygen and ozone on polythiophene-based thin-film transistors." APPLIED PHYSICS LETTERS 90 (2007): 123508.
"Flexible a-Si : H-based image sensors fabricated by digital lithography." In AMORPHOUS AND POLYCRYSTALLINE THIN-FILM SILICON SCIENCE AND TECHNOLOGY 2007, edited by V Chu, S Miyazaki, A Nathan, J Yang and HW Zan, 199-203. Vol. 989. MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS 989. 506 KEYSTONE DRIVE, WARRENDALE, PA 15088-7563 USA: Mat Res Soc, 2007.
"Characterization of Flexible Image Sensor Arrays with Bulk Heterojunction Organic Photodiodes." In ORGANIC FIELD-EFFECT TRANSISTORS VII AND ORGANIC SEMICONDUCTORS IN SENSORS AND BIOELECTRONICS, edited by Z Bao, I. McCulloch, R Shinar and GG Malliaras, 70541M. Vol. 7054. PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) 7054. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA: SPIE; Air Prod & Chem; Dai Nippon Printing Co Ltd; HC Stark GmbH; Hitachi Cambridge Lab; Merck Chem Ltd; Plast Logic Lt; Sigma Aldrich Co, 2008.
"Flexible image sensor array with bulk heterojunction organic photodiode." APPLIED PHYSICS LETTERS 92 (2008): 213303.
"Gate bias stress effects due to polymer gate dielectrics in organic thin-film transistors." JOURNAL OF APPLIED PHYSICS 103 (2008): 044506.
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