Publications

Found 115 results
Author Title Type [ Year(Asc)]
Filters: First Letter Of Title is C  [Clear All Filters]
2024
Yapparov, R., T. Tak, J. Ewing, F. Wu, S. Nakamura, S. P. DenBaars, J. S. Speck, and S. Marcinkevičius, "Carrier Diffusion in long wavelength InGaN quantum well LEDs after injection through V-defects", Applied Physics Letters, vol. 125, issue 3, 07/2024.
Hendricks, N. S., A. E. Islam, E. A. Sowers, J. Williams, D. M. Dryden, K. J. Liddy, W. Wang, J. S. Speck, and A. J. Green, "Current transport mechanisms of metal/TiO2/Beta-Ga2O3 diodes", Journal of Applied Physics, vol. 135, issue 9, 2024.
2023
Tsai, T-Y., K. Shek Qwah, J-P. Banon, M. Filoche, C. Weisbuch, Y-R. Wu, and J. S. Speck, "Carrier localization in III-nitride versus conventional III-V semiconductors: A study on the effects of alloy disorder using landscape theory and the Schrodinger equation", Physical Review Applied, vol. 20, issue 4, 2023.
Itoh, T., A. Mauze, Y. Zhang, and J. S. Speck, "Continuous Si doping in (010) and (001) β-Ga2O3 films by plasma-assisted molecular beam epitaxy", APL Materials, vol. 11, 04, 2023.
Alema, F., T. Itoh, W. Brand, A. Osinsky, and J. S. Speck, "Controllable nitrogen doping of MOCVD Ga2O3 using NH3", Applied Physics Letters, vol. 122, 2023.
2022
Mauze, A., T. Itoh, Y. Zhang, E. Deagueros, F. Wu, and J. S. Speck, "Coherently strained (001) β-(AlxGa1−x)2O3 thin films on β-Ga2O3: Growth and compositional analysis", Journal of Applied Physics, vol. 132, 09, 2022.
2021
Itoh, T., A. Mauze, Y. Zhang, and J. S. Speck, "Crystal growth on (110) β-Ga2O3 via plasma-assisted molecular beam epitaxy", Oxide-based Materials and Devices XII: International Society for Optics and Photonics, 2021.
2020
Smith, J. M., R. Ley, M. S. Wong, Y. Hyun Baek, J. Hun Kang, C. Hon Kim, M. J. Gordon, S. Nakamura, J. S. Speck, and S. P. DenBaars, "Comparison of size-dependent characteristics of blue and green InGaN microLEDs down to 1 μm in diameter", Applied Physics Letters, vol. 116, pp. 071102, 2020.
2019
Reilly, C. E., B. Bonef, S. Nakamura, J. S. Speck, S. P. DenBaars, and S. Keller, "Characterization of InGaN quantum dots grown by metalorganic chemical vapor deposition", Semiconductor Science and Technology, vol. 34, pp. 125002, oct, 2019.
2018
Filoche, M., M. Piccardo, C-K. Li, Y-R. Wu, J. S. Speck, B. Bonef, R. M. Farrell, S. Mayboroda, J-M. Lentali, L. Martinelli, et al., "Carrier localization induced by alloy disorder in nitride devices: theory and experiments (Conference Presentation)", Gallium Nitride Materials and Devices XIII, vol. 10532: International Society for Optics and Photonics, pp. 105320S, 2018.
Farzana, E., H. M. Foronda, C. M. Jackson, T. Razzak, Z. Zhang, J. S. Speck, A. R. Arehart, and S. A. Ringel, "Characterization of traps in InAlN by optically and thermally stimulated deep level defect spectroscopies", Journal of Applied Physics, vol. 124, pp. 145703, 2018.
Reparaz, J. S., P. K. da Silva, A. H. Romero, J. Serrano, M. R. Wagner, G. Callsen, S. J. Choi, J. S. Speck, and A. R. Goñi, "Comparative study of the pressure dependence of optical-phonon transverse-effective charges and linewidths in wurtzite InN", Phys. Rev. B, vol. 98, pp. 165204, Oct, 2018.
2017
Shen, J-X., D. Wickramaratne, C. E. Dreyer, A. Alkauskas, E. Young, J. S. Speck, and C. G. Van de Walle, "Calcium as a nonradiative recombination center in InGaN", Applied Physics Express, vol. 10, no. 2: IOP Publishing, pp. 021001, 2017.
Li, H., B. Mazumder, B. Bonef, S. Keller, S. Wienecke, J. S. Speck, S. P. DenBaars, and U. K. Mishra, "Characterization of N-polar AlN in GaN/AlN/(Al, Ga) N heterostructures grown by metal-organic chemical vapor deposition", Semiconductor Science and Technology, vol. 32, no. 11: IOP Publishing, pp. 115004, 2017.
Bonef, B., R. Cramer, F. Wu, and J. S. Speck, "Correlated Transmission Electron Microscopy and Atom Probe Tomography study of Boron distribution in BGaN", Microscopy and Microanalysis, vol. 23, no. S1: Cambridge University Press, pp. 668–669, 2017.
2016
Young, EC., N. Grandjean, TE. Mates, and JS. Speck, "Calcium impurity as a source of non-radiative recombination in (In, Ga) N layers grown by molecular beam epitaxy", Applied Physics Letters, vol. 109, no. 21: AIP Publishing, pp. 212103, 2016.
Hogan, J. E., S. W. Kaun, E. Ahmadi, Y. Oshima, and J. S. Speck, "Chlorine-based dry etching of β-Ga2O3", Semiconductor Science and Technology, vol. 31, no. 6: IOP Publishing, pp. 065006, 2016.
Leonard, JT., EC. Young, BP. Yonkee, DA. Cohen, C. Shen, T. Margalith, T. Khee Ng, SP. DenBaars, B. S. Ooi, JS. Speck, et al., "Comparison of nonpolar III-nitride vertical-cavity surface-emitting lasers with tunnel junction and ITO intracavity contacts", Gallium Nitride Materials and Devices XI, vol. 9748: International Society for Optics and Photonics, pp. 97481B, 2016.
Oshima, Y., E. Ahmadi, S. C. Badescu, F. Wu, and J. S. Speck, "Composition determination of β-(Al x Ga1- x) 2O3 layers coherently grown on (010) β-Ga2O3 substrates by high-resolution X-ray diffraction", Applied Physics Express, vol. 9, no. 6: IOP Publishing, pp. 061102, 2016.
Zhang, Z., D. Cardwell, A. Sasikumar, ECH. Kyle, J. Chen, EX. Zhang, DM. Fleetwood, RD. Schrimpf, JS. Speck, AR. Arehart, et al., "Correlation of proton irradiation induced threshold voltage shifts to deep level traps in AlGaN/GaN heterostructures", Journal of Applied Physics, vol. 119, no. 16: AIP Publishing, pp. 165704, 2016.
Smirnov, AM., EC. Young, VE. Bougrov, JS. Speck, and AE. Romanov, "Critical thickness for the formation of misfit dislocations originating from prismatic slip in semipolar and nonpolar III-nitride heterostructures", APL Materials, vol. 4, no. 1: AIP Publishing, pp. 016105, 2016.
Foronda, H. M., A. E. Romanov, E. C. Young, C. A. Robertson, G. E. Beltz, and J. S. Speck, "Curvature and bow of bulk GaN substrates", Journal of Applied Physics, vol. 120, no. 3: AIP Publishing, pp. 035104, 2016.
Foronda, H. Miguel, A. E. Romanov, E. C. Young, C. A. Robertson, G. E. Beltz, and J. S. Speck, "Curvature of HVPE c-plane grown GaN wafers in the relation to stress gradients caused by inclined threading dislocations", Compound Semiconductor Week (CSW)[Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS), 2016: IEEE, pp. 1–1, 2016.
2015
Korhonen, E., V. Prozheeva, F. Tuomisto, O. Bierwagen, JS. Speck, ME. White, Z. Galazka, H. Liu, N. Izyumskaya, V. Avrutin, et al., "Cation vacancies and electrical compensation in Sb-doped thin-film SnO2 and ZnO", Semiconductor Science and Technology, vol. 30, no. 2: IOP Publishing, pp. 024011, 2015.
Megalini, L., D. L. Becerra, R. M. Farrell, A. Pourhashemi, J. S. Speck, S. Nakamura, S. P. DenBaars, and D. A. Cohen, "Continuous-wave operation of a InGaN laser diode with a photoelectrochemically etched current aperture", Applied Physics Express, vol. 8, no. 4: IOP Publishing, pp. 042701, 2015.

Pages