Characterization of traps in InAlN by optically and thermally stimulated deep level defect spectroscopies

TitleCharacterization of traps in InAlN by optically and thermally stimulated deep level defect spectroscopies
Publication TypeJournal Article
Year of Publication2018
AuthorsFarzana, E., H. M. Foronda, C. M. Jackson, T. Razzak, Z. Zhang, J. S. Speck, A. R. Arehart, and S. A. Ringel
JournalJournal of Applied Physics
Volume124
Pagination145703
URLhttps://doi.org/10.1063/1.5050949
DOI10.1063/1.5050949