Publications

Found 301 results
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2011
Romanov, A. E., E. C. Young, F. Wu, A. Tyagi, C. S. Gallinat, S. Nakamura, S. P. DenBaars, and J. S. Speck, "Basal plane misfit dislocations and stress relaxation in III-nitride semipolar heteroepitaxy", Journal of Applied Physics, vol. 109, no. 10: AIP, pp. 103522, 2011.
Hsu, P. Shan, J. Sonoda, K. M. Kelchner, A. Tyagi, R. M. Farrell, D. A. Haeger, E. C. Young, A. E. Romanov, K. Fujito, H. Ohta, et al., "Blue InGaN/GaN laser diodes grown on (33$$\backslash$bar 3$\backslash$bar 1$) free-standing GaN substrates", physica status solidi (c), vol. 8, no. 7-8: WILEY-VCH Verlag, pp. 2390–2392, 2011.
Zhang, Z., C. Hurni, A. Arehart, J. Speck, and S. Ringel, "Deep Traps in M-Plane GaN Grown by Ammonia MBE", Minerals, Metals and Materials Society/AIME, 420 Commonwealth Dr., P. O. Box 430 Warrendale PA 15086 United States.[np]. Jun: Minerals, Metals and Materials Society/AIME, 420 Commonwealth Dr., P. O. Box 430 Warrendale PA 15086 United States, 2011.
Young, E. C., A. E. Romanov, and J. S. Speck, "Determination of Composition and Lattice Relaxation in Semipolar Ternary (In, Al, Ga) N Strained Layers from Symmetric X-ray Diffraction Measurements", Applied physics express, vol. 4, no. 6: IOP Publishing, pp. 061001, 2011.
Sasikumar, A., A. Arehart, S. Kaun, M. Hoi Wong, J. Speck, U. Mishra, and S. Ringe, "Direct Correlation between EC-0. 57 eV Trap Generation and Field-Induced Degradation in AlGaN/GaN High Electron Mobility Transistors", Minerals, Metals and Materials Society/AIME, 420 Commonwealth Dr., P. O. Box 430 Warrendale PA 15086 United States.[np]. Jun: Minerals, Metals and Materials Society/AIME, 420 Commonwealth Dr., P. O. Box 430 Warrendale PA 15086 United States, 2011.
Rangel, E., E. Matioli, Y-S. Choi, C. Weisbuch, J. S. Speck, and E. L. Hu, "Directionality control through selective excitation of low-order guided modes in thin-film InGaN photonic crystal light-emitting diodes", Applied physics letters, vol. 98, no. 8: AIP, pp. 081104, 2011.
Dasgupta, S., A. Raman, J. S. Speck, U. K. Mishra, and others, "Experimental demonstration of III-nitride hot-electron transistor with GaN base", IEEE Electron Device Letters, vol. 32, no. 9: IEEE, pp. 1212–1214, 2011.
Raring, J. W., M. C. Schmidt, C. Poblenz, B. Li, Y-C. Chang, M. J. Mondry, Y-. Da Lin, M. R. Krames, R. Craig, J. S. Speck, et al., "High-performance blue and green laser diodes based on nonpolar/semipolar bulk GaN substrates", Gallium Nitride Materials and Devices Vi, vol. 7939: International Society for Optics and Photonics, pp. 79390Y, 2011.
Schmidt, M. C., C. Poblenz, Y-C. Chang, B. Li, M. J. Mondry, J. Iveland, M. R. Krames, R. Craig, J. W. Raring, J. S. Speck, et al., "High-performance blue and green laser diodes based on nonpolar/semipolar GaN substrates", Laser Technology for Defense and Security VII, vol. 8039: International Society for Optics and Photonics, pp. 80390D, 2011.
Rangel, E., E. Matioli, J. S. Speck, C. Weisbuch, and E. Hu, "Impact of the vertical layer structure on the emission directionality of thin-film InGaN photonic crystal LEDs", CLEO: Science and Innovations: Optical Society of America, pp. CMA3, 2011.
Wu, F., A. Tyagi, EC. Young, AE. Romanov, K. Fujito, SP. DenBaars, S. Nakamura, and JS. Speck, "Misfit dislocation formation at heterointerfaces in (Al, In) GaN heteroepitaxial layers grown on semipolar free-standing GaN substrates", Journal of Applied Physics, vol. 109, no. 3: AIP, pp. 033505, 2011.
Hsu, P. Shan, E. Young, A. Romanov, K. Fujito, J. Speck, and S. Nakamura, "Misfit Dislocation Formation in Partially Strain-Relaxed(11-22) Semipolar InGaN", Minerals, Metals and Materials Society/AIME, 420 Commonwealth Dr., P. O. Box 430 Warrendale PA 15086 United States.[np]. Jun: Minerals, Metals and Materials Society/AIME, 420 Commonwealth Dr., P. O. Box 430 Warrendale PA 15086 United States, 2011.
Hsu, P. Shan, E. C. Young, A. E. Romanov, K. Fujito, S. P. DenBaars, S. Nakamura, and J. S. Speck, "Misfit dislocation formation via pre-existing threading dislocation glide in (11 2\= 2) semipolar heteroepitaxy", Applied Physics Letters, vol. 99, no. 8: AIP, pp. 081912, 2011.
Arehart, AR., AC. Malonis, C. Poblenz, Y. Pei, JS. Speck, UK. Mishra, and SA. Ringel, "Next generation defect characterization in nitride HEMTs", physica status solidi (c), vol. 8, no. 7-8: Wiley Online Library, pp. 2242–2244, 2011.
Rajan, S., C. Soo Suh, J. S. Speck, and U. K. Mishra, N-polar aluminum gallium nitride/gallium nitride enhancement-mode field effect transistor, 2011.
Wu, F., EC. Young, I. Koslow, MT. Hardy, PS. Hsu, AE. Romanov, S. Nakamura, SP. DenBaars, and JS. Speck, "Observation of non-basal slip in semipolar InxGa1-xN/GaN heterostructures", Applied Physics Letters, vol. 99, no. 25: AIP, pp. 251909, 2011.
Raring, JW., MC. Schmidt, C. Poblenz, Y. Lin, C. Bai, P. Rudy, JS. Speck, SP. DenBaars, and S. Nakamura, "Recent progress in InGaN-based laser diodes fabricated on nonpolar/semipolar substrates", Photonics Conference (PHO), 2011 IEEE: IEEE, pp. 503–504, 2011.
Raring, JW., MC. Schmidt, C. Poblenz, Y. Lin, C. Bai, P. Rudy, JS. Speck, SP. DenBaars, and S. Nakamura, "Recent progress in InGaN-based laser diodes fabricated on nonpolar/semipolar substrates", Photonics Conference (PHO), 2011 IEEE: IEEE, pp. 503–504, 2011.
Young, E. C., A. E. Romanov, and J. S. Speck, "Semiconductors, dielectrics, and organic materials-061001 Determination of Composition and Lattice Relaxation in Semipolar Ternary (In, Al, Ga) N Strained Layers from Symmetric X-ray Diffraction Measurements", Applied Physics Express, vol. 4, no. 6, 2011.
Roy, T., EX. Zhang, YS. Puzyrev, X. Shen, DM. Fleetwood, RD. Schrimpf, G. Koblmueller, R. Chu, C. Poblenz, N. Fichtenbaum, et al., "Temperature-dependence and microscopic origin of low frequency 1/f noise in GaN/AlGaN high electron mobility transistors", Applied Physics Letters, vol. 99, no. 20: AIP, pp. 203501, 2011.
2010
Young, E. C., A. E. Romanov, C. S. Gallinat, A. Hirai, G. E. Beltz, and J. S. Speck, "Anisotropy of tensile stresses and cracking in nonbasal plane Al x Ga 1- x N/GaN heterostructures", Applied Physics Letters, vol. 96, no. 4: AIP, pp. 041913, 2010.
Young, E. C., C. S. Gallinat, A. E. Romanov, A. Tyagi, F. Wu, and J. S. Speck, "Critical thickness for onset of plastic relaxation in (1122) and (2021) semipolar AlGaN heterostructures", Applied physics express, vol. 3, no. 11: IOP Publishing, pp. 111002, 2010.
Arehart, AR., C. Poblenz, JS. Speck, and SA. Ringel, "Effect of nitrogen plasma power on defect levels in Ni/n-GaN Schottky diodes grown by molecular beam epitaxy", Journal of Applied Physics, vol. 107, no. 5: AIP, pp. 054518, 2010.
Matioli, E., B. Fleury, E. Rangel, T. Melo, E. Hu, J. Speck, and C. Weisbuch, "High extraction efficiency GaN-based photonic-crystal light-emitting diodes: Comparison of extraction lengths between surface and embedded photonic crystals", Applied physics express, vol. 3, no. 3: IOP Publishing, pp. 032103, 2010.
Matioli, E., E. Rangel, M. Iza, B. Fleury, N. Pfaff, J. Speck, E. Hu, and C. Weisbuch, "High extraction efficiency light-emitting diodes based on embedded air-gap photonic-crystals", Applied physics letters, vol. 96, no. 3: AIP, pp. 031108, 2010.

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