| Title | Next generation defect characterization in nitride HEMTs |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Arehart, AR., AC. Malonis, C. Poblenz, Y. Pei, JS. Speck, UK. Mishra, and SA. Ringel |
| Journal | physica status solidi (c) |
| Volume | 8 |
| Pagination | 2242–2244 |