Determination of Composition and Lattice Relaxation in Semipolar Ternary (In, Al, Ga) N Strained Layers from Symmetric X-ray Diffraction Measurements

TitleDetermination of Composition and Lattice Relaxation in Semipolar Ternary (In, Al, Ga) N Strained Layers from Symmetric X-ray Diffraction Measurements
Publication TypeJournal Article
Year of Publication2011
AuthorsYoung, E. C., A. E. Romanov, and J. S. Speck
JournalApplied physics express
Volume4
Pagination061001