| Title | Direct Correlation between EC-0. 57 eV Trap Generation and Field-Induced Degradation in AlGaN/GaN High Electron Mobility Transistors |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Sasikumar, A., A. Arehart, S. Kaun, M. Hoi Wong, J. Speck, U. Mishra, and S. Ringe |
| Journal | Minerals, Metals and Materials Society/AIME, 420 Commonwealth Dr., P. O. Box 430 Warrendale PA 15086 United States.[np]. Jun |