| Title | Temperature-dependence and microscopic origin of low frequency 1/f noise in GaN/AlGaN high electron mobility transistors |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Roy, T., EX. Zhang, YS. Puzyrev, X. Shen, DM. Fleetwood, RD. Schrimpf, G. Koblmueller, R. Chu, C. Poblenz, N. Fichtenbaum, and others |
| Journal | Applied Physics Letters |
| Volume | 99 |
| Pagination | 203501 |