Publications

Found 2112 results
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2002
Andrews, AM., and JS. Speck, "Antimony segregation in the oxidation of strained AlAsSb interlayers", Molecular Beam Epitaxy, 2002 International Conference on: IEEE, pp. 181–182, 2002.
Glaser, ER., WE. Carlos, GCB. Braga, JA. Freitas Jr, WJ. Moore, BV. Shanabrook, AE. Wickenden, DD. Koleske, RL. Henry, MW. Bayerl, et al., "Characterization of nitrides by electron paramagnetic resonance (EPR) and optically detected magnetic resonance (ODMR)", Materials Science and Engineering: B, vol. 93, no. 1-3: Elsevier, pp. 39–48, 2002.
Katona, TM., JS. Speck, and SP. DenBaars, "Control of crystallographic tilt in GaN grown on Si (111) by cantilever epitaxy", Applied Physics Letters, vol. 81, no. 19: AIP, pp. 3558–3560, 2002.
Andrews, AM., and JS. Speck, "Crosshatch surface morphology in mismatched films", Molecular Beam Epitaxy, 2002 International Conference on: IEEE, pp. 23–24, 2002.
Hsu, JWP., MJ. Manfra, RJ. Molnar, B. Heying, and JS. Speck, "Direct imaging of reverse-bias leakage through pure screw dislocations in GaN films grown by molecular beam epitaxy on GaN templates", Applied physics letters, vol. 81, no. 1: AIP, pp. 79–81, 2002.
Miller, EJ., ET. Yu, C. Poblenz, C. Elsass, and JS. Speck, "Direct measurement of the polarization charge in AlGaN/GaN heterostructures using capacitance–voltage carrier profiling", Applied physics letters, vol. 80, no. 19: AIP, pp. 3551–3553, 2002.
Simpkins, B. S., Y. T Edward, P. Waltereit, and J. S. Speck, "Distinguishing negatively-charged and highly conductive dislocations in gallium nitride using scanning Kelvin probe and conductive atomic force microscopy", MRS Online Proceedings Library Archive, vol. 743: Cambridge University Press, 2002.
Simpkins, B. S., Y. T Edward, P. Waltereit, and J. S. Speck, "Distinguishing negatively-charged and highly conductive dislocations in gallium nitride using scanning Kelvin probe and conductive atomic force microscopy", MRS Online Proceedings Library Archive, vol. 743: Cambridge University Press, 2002.
Jimnez, A., D. Buttari, D. Jena, R. Coffie, S. Heikman, NQ. Zhang, L. Shen, E. Calleja, E. Munoz, J. Speck, et al., "Effect of p-doped overlayer thickness on RF-dispersion in GaN junction FETs", IEEE Electron Device Letters, vol. 23, no. 6: IEEE, pp. 306–308, 2002.
Jimnez, A., D. Buttari, D. Jena, R. Coffie, S. Heikman, NQ. Zhang, L. Shen, E. Calleja, E. Munoz, J. Speck, et al., "Effect of p-doped overlayer thickness on RF-dispersion in GaN junction FETs", IEEE Electron Device Letters, vol. 23, no. 6: IEEE, pp. 306–308, 2002.
Katona, TM., JS. Speck, and SP. DenBaars, "Effect of the nucleation layer on stress during cantilever epitaxy of GaN on Si (111)", physica status solidi (a), vol. 194, no. 2: WILEY-VCH Verlag Berlin, pp. 550–553, 2002.
Waltereit, P., AE. Romanov, and JS. Speck, "Electronic properties of GaN induced by a subsurface stressor", Applied physics letters, vol. 81, no. 25: AIP, pp. 4754–4756, 2002.
Shokhovets, S., R. Goldhahn, G. Gobsch, O. Ambacher, IP. Smorchkova, JS. Speck, U. Mishra, A. Link, M. Hermann, and M. Eickhoff, "Electroreflectance and Photoreflectance Studies of Electric Fields in Pt/GaN Schottky Diodes and AlGaN/GaN Heterostructures", MRS Online Proceedings Library Archive, vol. 743: Cambridge University Press, 2002.
Shokhovets, S., R. Goldhahn, G. Gobsch, O. Ambacher, IP. Smorchkova, JS. Speck, U. Mishra, A. Link, M. Hermann, and M. Eickhoff, "Electroreflectance and Photoreflectance Studies of Electric Fields in Pt/GaN Schottky Diodes and AlGaN/GaN Heterostructures", MRS Online Proceedings Library Archive, vol. 743: Cambridge University Press, 2002.
Shokhovets, S., R. Goldhahn, G. Gobsch, O. Ambacher, IP. Smorchkova, JS. Speck, U. Mishra, A. Link, M. Hermann, and M. Eickhoff, "Electroreflectance and Photoreflectance Studies of Electric Fields in Pt/GaN Schottky Diodes and AlGaN/GaN Heterostructures", MRS Online Proceedings Library Archive, vol. 743: Cambridge University Press, 2002.
Smorchkova, IP., L. Chen, T. Mates, L. Shen, S. Heikman, B. Moran, S. Keller, SP. DenBaars, JS. Speck, and UK. Mishra, "Erratum:ìAlN/GaN and (Al, Ga) N/AlN/GaN two-dimensional electron gas structures grown by plasma-assisted molecular-beam epitaxyî[J. Appl. Phys. 90, 5196 (2001)]", Journal of Applied Physics, vol. 91, no. 7: AIP, pp. 4780–4780, 2002.
Smorchkova, IP., L. Chen, T. Mates, L. Shen, S. Heikman, B. Moran, S. Keller, SP. DenBaars, JS. Speck, and UK. Mishra, "Erratum:ìAlN/GaN and (Al, Ga) N/AlN/GaN two-dimensional electron gas structures grown by plasma-assisted molecular-beam epitaxyî[J. Appl. Phys. 90, 5196 (2001)]", Journal of Applied Physics, vol. 91, no. 7: AIP, pp. 4780–4780, 2002.
Smorchkova, IP., L. Chen, T. Mates, L. Shen, S. Heikman, B. Moran, S. Keller, SP. DenBaars, JS. Speck, and UK. Mishra, "Erratum:ìAlN/GaN and (Al, Ga) N/AlN/GaN two-dimensional electron gas structures grown by plasma-assisted molecular-beam epitaxyî[J. Appl. Phys. 90, 5196 (2001)]", Journal of Applied Physics, vol. 91, no. 7: AIP, pp. 4780–4780, 2002.
HUANG, S-Y., R-H. HORNG, W-K. WANG, T-E. YU, P-R. LIN, D-S. WUU, A. Murai, C. Kruse, K. Samonji, L. McCarthy, et al., "Extended abstracts of the... Conference on Solid State Devices and Materials 2005, 712-713, 2005-09-13", Appl. Phys. Lett, vol. 80, pp. 2198, 2002.

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