| Title | Direct measurement of the polarization charge in AlGaN/GaN heterostructures using capacitance–voltage carrier profiling |
| Publication Type | Journal Article |
| Year of Publication | 2002 |
| Authors | Miller, EJ., ET. Yu, C. Poblenz, C. Elsass, and JS. Speck |
| Journal | Applied physics letters |
| Volume | 80 |
| Pagination | 3551–3553 |