| Title | Direct imaging of reverse-bias leakage through pure screw dislocations in GaN films grown by molecular beam epitaxy on GaN templates |
| Publication Type | Journal Article |
| Year of Publication | 2002 |
| Authors | Hsu, JWP., MJ. Manfra, RJ. Molnar, B. Heying, and JS. Speck |
| Journal | Applied physics letters |
| Volume | 81 |
| Pagination | 79–81 |