Distinguishing negatively-charged and highly conductive dislocations in gallium nitride using scanning Kelvin probe and conductive atomic force microscopy

TitleDistinguishing negatively-charged and highly conductive dislocations in gallium nitride using scanning Kelvin probe and conductive atomic force microscopy
Publication TypeJournal Article
Year of Publication2002
AuthorsSimpkins, B. S., Y. T Edward, P. Waltereit, and J. S. Speck
JournalMRS Online Proceedings Library Archive
Volume743