| Title | Distinguishing negatively-charged and highly conductive dislocations in gallium nitride using scanning Kelvin probe and conductive atomic force microscopy |
| Publication Type | Journal Article |
| Year of Publication | 2002 |
| Authors | Simpkins, B. S., Y. T Edward, P. Waltereit, and J. S. Speck |
| Journal | MRS Online Proceedings Library Archive |
| Volume | 743 |