Publications

Found 112 results
Author Title Type [ Year(Desc)]
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2003
Ringel, SA., A. Armstrong, A. Arehart, B. Moran, U. K. Mishra, and JS. Speck, "Detection of carbon-related bandgap states in GaN using deep level optical spectroscopy", Compound Semiconductors, 2003. International Symposium on: IEEE, pp. 4–5, 2003.
Zhang, JP., Y. Wu, GS. Cheng, M. Moskovits, and JS. Speck, "Dislocation-free GaN nanowires", Microscopy and Microanalysis, vol. 9, no. S02: Cambridge University Press, pp. 342–343, 2003.
2006
Chakraborty, A., KC. Kim, F. Wu, JS. Speck, SP. DenBaars, and UK. Mishra, "Defect reduction in nonpolar a-plane GaN films using in situ Si N x nanomask", Applied physics letters, vol. 89, no. 4: AIP, pp. 041903, 2006.
Zhou, X., ET. Yu, DS. Green, and JS. Speck, "Dependence of local electronic structure in p-type GaN on crystal polarity and presence of inversion domain boundaries", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, vol. 24, no. 1: AVS, pp. 245–249, 2006.
Kamber, D. S., Y. Wu, B. A. Haskell, S. Newman, S. P. DenBaars, J. S. Speck, and S. Nakamura, "Direct heteroepitaxial growth of thick AlN layers on sapphire substrates by hydride vapor phase epitaxy", Journal of crystal growth, vol. 297, no. 2: Elsevier, pp. 321–325, 2006.
2008
Arehart, AR., A. Corrion, C. Poblenz, JS. Speck, UK. Mishra, and SA. Ringel, "Deep level optical and thermal spectroscopy of traps in n-GaN grown by ammonia molecular beam epitaxy", Applied Physics Letters, vol. 93, no. 11: AIP, pp. 112101, 2008.
Imer, B. M., J. S. Speck, and S. P. DenBaars, Defect reduction of non-polar and semi-polar III-Nitrides with sidewall lateral epitaxial overgrowth (SLEO), 2008.
Asamizu, H., M. Saito, K. Fujito, J. S. Speck, S. P. DenBaars, and S. Nakamura, "Demonstration of 426 nm InGaN/GaN laser diodes fabricated on free-standing semipolar (1122) gallium nitride substrates", Applied physics express, vol. 1, no. 9: IOP Publishing, pp. 091102, 2008.
Speck, J. S., Development of Advanced Ill-Nitride Materials: DTIC Document, 2008.
Speck, J. S., Development of III-Nitride Materials for IR Applications: DTIC Document, 2008.
Hol\`y, V., T. Baumbach, D. Lübbert, L. Helfen, M. Ellyan, P. Mikulík, S. Keller, SP. DenBaars, and J. Speck, "Diffuse x-ray scattering from statistically inhomogeneous distributions of threading dislocations beyond the ergodic hypothesis", Physical Review B, vol. 77, no. 9: American Physical Society, pp. 094102, 2008.
McGroddy, K., A. David, E. Matioli, M. Iza, S. Nakamura, S. DenBaars, JS. Speck, C. Weisbuch, and EL. Hu, "Directional emission control and increased light extraction in GaN photonic crystal light emitting diodes", Applied physics letters, vol. 93, no. 10: AIP, pp. 103502, 2008.
Koblmüller, G., R. Chu, F. Wu, U. K. Mishra, and J. S. Speck, "Dislocation reduction in AlGaN/GaN heterostructures on 4H-SiC by molecular beam epitaxy in the thermal decomposition regime", Applied physics express, vol. 1, no. 6: IOP Publishing, pp. 061103, 2008.

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