Publications

Found 1586 results
Author Title Type [ Year(Asc)]
2012
Das, NC., ML. Reed, AV. Sampath, H. Shen, M. Wraback, RM. Farrell, M. Iza, SC. Cruz, , NG. Young, et al., "Anti Reflection (AR) Coating for Indium Gallium Nitride (InGaN) Solar Cells", Army Research Laboratory Report, 08/2012.
Henry, T. A., A. Armstrong, K. M. Kelchner, S. Nakamura, SP. DenBaars, and JS. Speck, "Assessment of deep level defects in m-plane GaN grown by metalorganic chemical vapor deposition", Applied Physics Letters, vol. 100, no. 8: AIP, pp. 082103, 2012.
Mazumder, B., MH. Wong, CA. Hurni, JY. Zhang, UK. Mishra, and JS. Speck, "Asymmetric interfacial abruptness in N-polar and Ga-polar GaN/AlN/GaN heterostructures", Applied Physics Letters, vol. 101, no. 9: AIP, pp. 091601, 2012.
Choi, P-P., O. Cojocaru-Mirédin, D. Abou-Ras, R. Caballero, D. Raabe, V. S. Smentkowski, C. Gyung Park, G. Ho Gu, B. Mazumder, M. Hoi Wong, et al., "Atom probe tomography of compound semiconductors for photovoltaic and light-emitting device applications", Microscopy Today, vol. 20, no. 3: Cambridge University Press, pp. 18–24, 2012.
Hu, Y-L., S. Krämer, P. T. Fini, and J. S. Speck, "Atomic structure of prismatic stacking faults in nonpolar a-plane GaN epitaxial layers", Applied Physics Letters, vol. 101, no. 11: AIP, pp. 112102, 2012.
Hu, Y-L., S. Krämer, P. T. Fini, and J. S. Speck, "Atomic structure of prismatic stacking faults in nonpolar a-plane GaN epitaxial layers", Applied Physics Letters, vol. 101, pp. 112102, 2012.
Hurni, C. A., H. Kroemer, U. K. Mishra, and J. S. Speck, "Capacitance-voltage profiling on polar III-nitride heterostructures", Journal of Applied Physics, vol. 112, no. 8: AIP, pp. 083704, 2012.
Garrett, G. A., P. Rotella, H. Shen, M. Wraback, D. A. Haeger, R. B. Chung, N. Pfaff, E. C. Young, S. P. DenBaars, J. S. Speck, et al., "Carrier dynamics in active regions for ultraviolet optoelectronics grown on thick, relaxed AlGaN on semipolar bulk GaN", physica status solidi (b), vol. 249, no. 3: Wiley Online Library, pp. 507–510, 2012.
Lang, J. R., NG. Young, R. M. Farrell, Y-R. Wu, and JS. Speck, "Carrier escape mechanism dependence on barrier thickness and temperature in InGaN quantum well solar cells", Applied Physics Letters, vol. 101, no. 18: AIP, pp. 181105, 2012.
Lu, J., Y-L. Hu, D. F. Brown, F. Wu, S. Keller, J. S. Speck, S. P. DenBaars, and U. K. Mishra, "Charge and Mobility Enhancements in In-Polar InAl (Ga) N/Al (Ga) N/GaN Heterojunctions Grown by Metal–Organic Chemical Vapor Deposition Using a Graded Growth Strategy", Japanese Journal of Applied Physics, vol. 51, no. 11R: IOP Publishing, pp. 115502, 2012.
Brinkley, S. E., C. Lalau Keraly, J. Sonoda, C. Weisbuch, J. S. Speck, S. Nakamura, and S. P. DenBaars, "Chip shaping for light extraction enhancement of bulk c-plane light-emitting diodes", Applied Physics Express, vol. 5, no. 3: IOP Publishing, pp. 032104, 2012.
Young, E. C., F. Wu, A. E. Romanov, D. A. Haeger, S. Nakamura, S. P. DenBaars, D. A. Cohen, and J. S. Speck, "Compositionally graded relaxed AlGaN buffers on semipolar GaN for mid-ultraviolet emission", Applied Physics Letters, vol. 101, no. 14: AIP, pp. 142109, 2012.
Kaun, S. W., M. Hoi Wong, U. K. Mishra, and J. S. Speck, "Correlation between threading dislocation density and sheet resistance of AlGaN/AlN/GaN heterostructures grown by plasma-assisted molecular beam epitaxy", Applied Physics Letters, vol. 100, no. 26: AIP, pp. 262102, 2012.
Hurni, C. A., S. Choi, O. Bierwagen, and J. S. Speck, "Coupling resistance between n-type surface accumulation layer and p-type bulk in InN: Mg thin films", Applied Physics Letters, vol. 100, no. 8: AIP, pp. 082106, 2012.
Kim, K. C., M. C. Schmidt, F. Wu, A. Hirai, M. B. McLaurin, S. P. DenBaars, S. Nakamura, and J. S. Speck, CRYSTAL GROWTH OF M-PLANE AND SEMIPOLAR PLANES OF (Al, In, Ga, B) N ON VARIOUS SUBSTRATES, mar # " 22", 2012.
Zhang, Z., CA. Hurni, AR. Arehart, J. Yang, RC. Myers, JS. Speck, and SA. Ringel, "Deep traps in nonpolar m-plane GaN grown by ammonia-based molecular beam epitaxy", Applied Physics Letters, vol. 100, no. 5: AIP, pp. 052114, 2012.
Hardy, M. T., P. Shan Hsu, I. L. Koslow, D. Feezell, S. Nakamura, J. S. Speck, and S. DenBaars, "Demonstration of a Relaxed Waveguide Semipolar (202Ø1) InGaN/GaN Laser Diode", CLEO: Science and Innovations: Optical Society of America, pp. CTu2N–2, 2012.
Hardy, M. T., P. S. Hsu, I. Koslow, D. F. Feezell, S. Nakamura, J. S. Speck, and S. P. DenBaars, "Demonstration of a relaxed waveguide semipolar InGaN/GaN laser diode", Lasers and Electro-Optics (CLEO), 2012 Conference on: IEEE, pp. 1–2, 2012.
Yeluri, R., C. A. Hurni, S. Chowdhury, J. S. Speck, and U. K. Mishra, "Demonstration of Low ON-Resistance CAVETS with Ammonia MBE Grown Active p-GaN Layer as the Current Blocking Layer for High Power Applications", Meeting Abstracts, no. 30: The Electrochemical Society, pp. 2531–2531, 2012.
Holder, C., J. S. Speck, S. P. DenBaars, S. Nakamura, and D. Feezell, "Demonstration of nonpolar GaN-based vertical-cavity surface-emitting lasers", Applied Physics Express, vol. 5, no. 9: IOP Publishing, pp. 092104, 2012.
Toledo, N. G., D. J. Friedman, R. M. Farrell, E. E. Perl, C-T. Lin, J. E. Bowers, J. S. Speck, and U. K. Mishra, "Design of integrated III-nitride/non-III-nitride tandem photovoltaic devices", Journal of Applied Physics, vol. 111, no. 5: AIP, pp. 054503, 2012.
Sasikumar, A., A. Arehart, SA. Ringel, S. Kaun, MH. Wong, UK. Mishra, and JS. Speck, "Direct correlation between specific trap formation and electric stress-induced degradation in MBE-grown AlGaN/GaN HEMTs", Reliability Physics Symposium (IRPS), 2012 IEEE International: IEEE, pp. 2C–3, 2012.
Craven, M. D., S. P. DenBaars, J. S. Speck, and S. Nakamura, Dislocation reduction in non-polar iii-nitride thin films, 2012.
Jewell, J., D. Simeonov, S-C. Huang, Y-L. Hu, S. Nakamura, J. Speck, and C. Weisbuch, "Double embedded photonic crystals for extraction of guided light in light-emitting diodes", Applied Physics Letters, vol. 100, no. 17: AIP, pp. 171105, 2012.
Kaun, S. W., P. G. Burke, M. Hoi Wong, E. C. H. Kyle, U. K. Mishra, and J. S. Speck, "Effect of dislocations on electron mobility in AlGaN/GaN and AlGaN/AlN/GaN heterostructures", Applied Physics Letters, vol. 101, no. 26: AIP, pp. 262102, 2012.

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