| Title | Direct correlation between specific trap formation and electric stress-induced degradation in MBE-grown AlGaN/GaN HEMTs |
| Publication Type | Conference Paper |
| Year of Publication | 2012 |
| Authors | Sasikumar, A., A. Arehart, SA. Ringel, S. Kaun, MH. Wong, UK. Mishra, and JS. Speck |
| Conference Name | Reliability Physics Symposium (IRPS), 2012 IEEE International |
| Publisher | IEEE |