Assessment of deep level defects in m-plane GaN grown by metalorganic chemical vapor deposition

TitleAssessment of deep level defects in m-plane GaN grown by metalorganic chemical vapor deposition
Publication TypeJournal Article
Year of Publication2012
AuthorsHenry, T. A., A. Armstrong, K. M. Kelchner, S. Nakamura, SP. DenBaars, and JS. Speck
JournalApplied Physics Letters
Volume100
Pagination082103