Publications

Found 496 results
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2013
Young, NG., RM. Farrell, YL. Hu, Y. Terao, M. Iza, S. Keller, SP. DenBaars, S. Nakamura, and JS. Speck, "High performance thin quantum barrier InGaN/GaN solar cells on sapphire and bulk (0001) GaN substrates", Applied Physics Letters, vol. 103, no. 17: AIP, pp. 173903, 2013.
Zhang, Z., AR. Arehart, E. Cinkilic, J. Chen, EX. Zhang, DM. Fleetwood, RD. Schrimpf, B. McSkimming, JS. Speck, and SA. Ringel, "Impact of proton irradiation on deep level states in n-GaN", Applied Physics Letters, vol. 103, no. 4: AIP, pp. 042102, 2013.
Farrell, RM., DA. Haeger, K. Fujito, SP. DenBaars, S. Nakamura, and JS. Speck, "Morphological evolution of InGaN/GaN light-emitting diodes grown on free-standing m-plane GaN substrates", Journal of Applied Physics, vol. 113, no. 6: AIP, pp. 063504, 2013.
Marcinkevičius, S., Y. Zhao, KM. Kelchner, S. Nakamura, SP. DenBaars, and JS. Speck, "Near-field investigation of spatial variations of (20 2\= 1\=) InGaN quantum well emission spectra", Applied Physics Letters, vol. 103, no. 13: AIP, pp. 131116, 2013.
Marcinkevičius, S., KM. Kelchner, S. Nakamura, SP. DenBaars, and JS. Speck, "Optical properties of extended and localized states in m-plane InGaN quantum wells", Applied Physics Letters, vol. 102, no. 10: AIP, pp. 101102, 2013.
Marcinkevičius, S., KM. Kelchner, LY. Kuritzky, S. Nakamura, SP. DenBaars, and JS. Speck, "Photoexcited carrier recombination in wide m-plane InGaN/GaN quantum wells", Applied Physics Letters, vol. 103, no. 11: AIP, pp. 111107, 2013.
Pourhashemi, A., RM. Farrell, MT. Hardy, PS. Hsu, KM. Kelchner, JS. Speck, SP. DenBaars, and S. Nakamura, "Pulsed high-power AlGaN-cladding-free blue laser diodes on semipolar (20 2 1) GaN substrates", Applied Physics Letters, vol. 103, no. 15: AIP, pp. 151112, 2013.
Kaun, SW., MH. Wong, J. Lu, UK. Mishra, and JS. Speck, "Reduction of carbon proximity effects by including AlGaN back barriers in HEMTs on free-standing GaN", Electronics Letters, vol. 49, no. 14: IET Digital Library, pp. 893–895, 2013.
Cardwell, DW., A. Sasikumar, AR. Arehart, SW. Kaun, J. Lu, S. Keller, JS. Speck, UK. Mishra, SA. Ringel, and JP. Pelz, "Spatially-resolved spectroscopic measurements of Ec- 0.57 eV traps in AlGaN/GaN high electron mobility transistors", Applied Physics Letters, vol. 102, no. 19: AIP, pp. 193509, 2013.
Pimputkar, S., S. Kawabata, JS. Speck, and S. Nakamura, "Surface morphology study of basic ammonothermal GaN grown on non-polar GaN seed crystals of varying surface orientations from m-plane to a-plane", Journal of Crystal Growth, vol. 368: Elsevier, pp. 67–71, 2013.
2012
Sasikumar, A., A. Arehart, S. Kolluri, MH. Wong, S. Keller, SP. DenBaars, JS. Speck, UK. Mishra, and SA. Ringel, "Access-region defect spectroscopy of DC-stressed N-polar GaN MIS-HEMTs", IEEE Electron Device Letters, vol. 33, no. 5: IEEE, pp. 658–660, 2012.
DenBaars, SP., C-C. Pan, N. Pfaff, S. Tanaka, JS. Speck, and S. Nakamura, "Advances in GaN semiconductors for energy efficient solid state lighting", Photonics Conference (IPC), 2012 IEEE: IEEE, pp. 427–428, 2012.
Henry, T. A., A. Armstrong, K. M. Kelchner, S. Nakamura, SP. DenBaars, and JS. Speck, "Assessment of deep level defects in m-plane GaN grown by metalorganic chemical vapor deposition", Applied Physics Letters, vol. 100, no. 8: AIP, pp. 082103, 2012.
Mazumder, B., MH. Wong, CA. Hurni, JY. Zhang, UK. Mishra, and JS. Speck, "Asymmetric interfacial abruptness in N-polar and Ga-polar GaN/AlN/GaN heterostructures", Applied Physics Letters, vol. 101, no. 9: AIP, pp. 091601, 2012.
Lang, J. R., NG. Young, R. M. Farrell, Y-R. Wu, and JS. Speck, "Carrier escape mechanism dependence on barrier thickness and temperature in InGaN quantum well solar cells", Applied Physics Letters, vol. 101, no. 18: AIP, pp. 181105, 2012.
Zhang, Z., CA. Hurni, AR. Arehart, J. Yang, RC. Myers, JS. Speck, and SA. Ringel, "Deep traps in nonpolar m-plane GaN grown by ammonia-based molecular beam epitaxy", Applied Physics Letters, vol. 100, no. 5: AIP, pp. 052114, 2012.
Sasikumar, A., A. Arehart, SA. Ringel, S. Kaun, MH. Wong, UK. Mishra, and JS. Speck, "Direct correlation between specific trap formation and electric stress-induced degradation in MBE-grown AlGaN/GaN HEMTs", Reliability Physics Symposium (IRPS), 2012 IEEE International: IEEE, pp. 2C–3, 2012.
Mazumder, B., MH. Wong, CA. Hurni, JY. Zhang, UK. Mishra, and JS. Speck, "Erratum:ìAsymmetric interfacial abruptness in N-polar and Ga-polar GaN/AlN/GaN heterostructuresî[Appl. Phys. Lett. 101, 091601 (2012)]", Applied Physics Letters, vol. 101, no. 22: AIP, pp. 229902, 2012.
Kelchner, KM., SP. DenBaars, and JS. Speck, "GaN Laser Diodes on Nonpolar and Semipolar Planes", Semiconductors and Semimetals, vol. 86: Elsevier, pp. 149–182, 2012.
Corrion, AL., F. Wu, and JS. Speck, "Growth regimes during homoepitaxial growth of GaN by ammonia molecular beam epitaxy", Journal of Applied Physics, vol. 112, no. 5: AIP, pp. 054903, 2012.
Hu, Y., S. Kraemer, JS. Speck, and PT. Fini, "HAADF-STEM and TEM Investigation on the Structure of ${$-2110$}$ Prismatic Stacking Faults in a-plane GaN", Microscopy and Microanalysis, vol. 18, no. S2: Cambridge University Press, pp. 1342, 2012.
Farahani, SK. Vasheghani, TD. Veal, AM. Sanchez, O. Bierwagen, ME. White, S. Gorfman, PA. Thomas, JS. Speck, and CF. McConville, "Influence of charged-dislocation density variations on carrier mobility in heteroepitaxial semiconductors: The case of SnO 2 on sapphire", Physical Review B, vol. 86, no. 24: American Physical Society, pp. 245315, 2012.
Zhang, Z., CA. Hurni, AR. Arehart, JS. Speck, and SA. Ringel, "Influence of V/III growth flux ratio on trap states in m-plane GaN grown by ammonia-based molecular beam epitaxy", Applied Physics Letters, vol. 101, no. 15: AIP, pp. 152104, 2012.
Farrell, RM., EC. Young, F. Wu, SP. DenBaars, and JS. Speck, "Materials and growth issues for high-performance nonpolar and semipolar light-emitting devices", Semiconductor Science and Technology, vol. 27, no. 2: IOP Publishing, pp. 024001, 2012.
Cardwell, DW., AR. Arehart, C. Poblenz, Y. Pei, JS. Speck, UK. Mishra, SA. Ringel, and JP. Pelz, "Nm-scale measurements of fast surface potential transients in an AlGaN/GaN high electron mobility transistor", Applied Physics Letters, vol. 100, no. 19: AIP, pp. 193507, 2012.

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