Influence of V/III growth flux ratio on trap states in m-plane GaN grown by ammonia-based molecular beam epitaxy

TitleInfluence of V/III growth flux ratio on trap states in m-plane GaN grown by ammonia-based molecular beam epitaxy
Publication TypeJournal Article
Year of Publication2012
AuthorsZhang, Z., CA. Hurni, AR. Arehart, JS. Speck, and SA. Ringel
JournalApplied Physics Letters
Volume101
Pagination152104