Publications

Found 2098 results
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2023
Ho, W. Ying, C. W. Johnson, T. Tak, M. Sauty, Y. Chao Chow, S. Nakamura, A. Schmid, J. Peretti, C. Weisbuch, and J. S. Speck, "Steady-state junction current distribution in pn GaN diodes measured using low-energy electron microscopy (LEEM)", Applied Physics Letters, vol. 123, issue 3, 2023.
Ho, W. Ying, C. W. Johnson, T. Tak, M. Sauty, Y. Chao Chow, S. Nakamura, A. Schmid, J. Peretti, C. Weisbuch, and J. S. Speck, "Steady-state junction current distribution in pn GaN diodes measured using low-energy electron microscopy (LEEM)", Applied Physics Letters, vol. 123, issue 3, 2023.
Ho, W. Ying, C. W. Johnson, T. Tak, M. Sauty, Y. Chao Chow, S. Nakamura, A. Schmid, J. Peretti, C. Weisbuch, and J. S. Speck, "Steady-state junction current distribution in pn GaN diodes measured using low-energy electron microscopy (LEEM)", Applied Physics Letters, vol. 123, issue 3, 2023.
Wu, F., J. Ewing, C. Lynsky, M. Iza, S. Nakamura, S. P. DenBaars, and J. S. Speck, "Structure of V-defects in long wavelength GaN-based light emitting diodes", Journal of Applied Physics, vol. 133, 01, 2023.
Wu, F., J. Ewing, C. Lynsky, M. Iza, S. Nakamura, S. P. DenBaars, and J. S. Speck, "Structure of V-defects in long wavelength GaN-based light emitting diodes", Journal of Applied Physics, vol. 133, 01/2023.
Hendricks, N. S., E. Farzana, A. E. Islam, K. D. Leedy, K. J. Liddy, J. Williams, D. M. Dryden, A. M. Adams, J. S. Speck, K. D. Chabak, et al., "Vertical metal-dielectric-semiconductor diode on (001) Beta-Ga2O3 with high-k TiO2 interlayer exhibiting reduced turn-on voltage and leakage current and improved breakdown", Applied Physics Express, vol. 16, issue 7, 2023.
Farzana, E., S. Roy, N. S. Hendricks, S. Krishnamoorthy, and J. S. Speck, "Vertical PtOx/Pt/Beta-Ga2O3 Schottky diodes with high permittivity dielectric field plate for low leakage and high breakdown voltage", Applied Physics Letters, vol. 123, issue 19, 2023.
2024
Yapparov, R., T. Tak, J. Ewing, F. Wu, S. Nakamura, S. P. DenBaars, J. S. Speck, and S. Marcinkevičius, "Carrier Diffusion in long wavelength InGaN quantum well LEDs after injection through V-defects", Applied Physics Letters, vol. 125, issue 3, 07/2024.
Hendricks, N. S., A. E. Islam, E. A. Sowers, J. Williams, D. M. Dryden, K. J. Liddy, W. Wang, J. S. Speck, and A. J. Green, "Current transport mechanisms of metal/TiO2/Beta-Ga2O3 diodes", Journal of Applied Physics, vol. 135, issue 9, 2024.
Hendricks, N. S., A. E. Islam, E. A. Sowers, J. Williams, D. M. Dryden, K. J. Liddy, W. Wang, J. S. Speck, and A. J. Green, "Current transport mechanisms of metal/TiO2/Beta-Ga2O3 diodes", Journal of Applied Physics, vol. 135, issue 9, 2024.
Quevedo, A., F. Wu, T-Y. Tsai, J. J. Ewing, T. Tak, S. Gandrothula, S. Gee, X. Li, S. Nakamura, S. P. DenBaars, et al., "Dislocation half-loop control for optimal V-defect density in GaN-based light emitting diodes", Applied Physics Letters, vol. 125, issue 4, 07/2024.
Marcinkevičius, S., T. Tak, Y. Chao Chow, F. Wu, R. Yapparov, S. P. DenBaars, S. Nakamura, and J. S. Speck, "Dynamics of carrier injection through V-defects in long wavelength GaN LEDs", Applied Physics Letters, vol. 124, issue 18, 04/2024.
Rebollo, S., T. Itoh, S. Krishnamoorthy, and J. S. Speck, "Heated-H3PO4 etching of (001) Beta-Ga2O3", Applied Physics Letters, vol. 125, issue 1, 07/2024.
Wong, M. S., E. S. Trageser, H. Zhang, H-M. Chang, S. Gee, T. Tak, S. Gandrothula, C. Lee, J. S. Speck, S. Nakamura, et al., "III-nitride m-plane violet narrow ridge edge-emitting laser diodes with sidewall passivation using atomic layer deposition", Optics Express, vol. 32, issue 12, 06/2024.
Fornos, C., N. Alyabyeva, M. Sauty, W. Ying Ho, Y. Chao Chow, T. Tak, J. S. Speck, C. Weisbuch, Y. Lassailly, A. C. H. Rowe, et al., "Nanoscale mapping of inhomogeneities in the luminescence of operational nitride LEDs", Gallium Nitride Materials and Devices XIX, pp. PC1288608, 03/2024.
Fornos, C., N. Alyabyeva, M. Sauty, W. Ying Ho, Y. Chao Chow, T. Tak, J. S. Speck, C. Weisbuch, Y. Lassailly, A. C. H. Rowe, et al., "Nanoscale mapping of inhomogeneities in the luminescence of operational nitride LEDs", Gallium Nitride Materials and Devices XIX, pp. PC1288608, 03/2024.
Wong, M. S., S. Gee, T. Tak, S. Gandrothula, S. Rebollo, NG. Cha, J. S. Speck, and S. P. DenBaars, "Optical Analysis of III-nitride micro-light-emitting diodes with different sidewall treatments at low current density operation", Japanese Journal of Applied Physics, vol. 63, issue 4, 04/2024.
Tak, T., A. Quevedo, F. Wu, S. Gandrothula, J. J. Ewing, S. Gee, S. Nakamura, S. P. DenBaars, and J. S. Speck, "Planarization of p-GaN surfaces on MOCVD grown V-defect engineered GaN-based LEDs", Applied Physics Letters, vol. 124, issue 17, 04/2024.
Ewing, J. J., F. Wu, A. Quevedo, T. Tak, S. Nakamura, S. P. DenBaars, and J. S. Speck, "Pure edge-dislocation half-loops in low-temperature GaN for V-defect formation", Physical Review Applied, vol. 21, issue 6, 06/2024.
Islam, S., AS. Senarath, E. Farzana, DR. Ball, A. Sengupta, NS. Hendricks, A. Bhattacharyya, RA. Reed, EX. Zhang, JS. Speck, et al., "Single-Event Burnout in Vertical Beta-Ga2O3 Diodes with Pt/PtOx Schottky Contacts and High-k Field-Plate Dielectrics", IEEE Transactions on Nuclear Science, 2024.
Islam, S., AS. Senarath, E. Farzana, DR. Ball, A. Sengupta, NS. Hendricks, A. Bhattacharyya, RA. Reed, EX. Zhang, JS. Speck, et al., "Single-Event Burnout in Vertical Beta-Ga2O3 Diodes with Pt/PtOx Schottky Contacts and High-k Field-Plate Dielectrics", IEEE Transactions on Nuclear Science, 2024.
Islam, S., AS. Senarath, E. Farzana, DR. Ball, A. Sengupta, NS. Hendricks, A. Bhattacharyya, RA. Reed, EX. Zhang, JS. Speck, et al., "Single-Event Burnout in Vertical Beta-Ga2O3 Diodes with Pt/PtOx Schottky Contacts and High-k Field-Plate Dielectrics", IEEE Transactions on Nuclear Science, 2024.
Islam, S., AS. Senarath, E. Farzana, DR. Ball, A. Sengupta, NS. Hendricks, A. Bhattacharyya, RA. Reed, EX. Zhang, JS. Speck, et al., "Single-Event Burnout in Vertical Beta-Ga2O3 Diodes with Pt/PtOx Schottky Contacts and High-k Field-Plate Dielectrics", IEEE Transactions on Nuclear Science, 2024.

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