Pure edge-dislocation half-loops in low-temperature GaN for V-defect formation

TitlePure edge-dislocation half-loops in low-temperature GaN for V-defect formation
Publication TypeJournal Article
Year of Publication2024
AuthorsEwing, J. J., F. Wu, A. Quevedo, T. Tak, S. Nakamura, S. P. DenBaars, and J. S. Speck
JournalPhysical Review Applied
Volume21
Issue6
Date Published06/2024