Steady-state junction current distribution in pn GaN diodes measured using low-energy electron microscopy (LEEM)

TitleSteady-state junction current distribution in pn GaN diodes measured using low-energy electron microscopy (LEEM)
Publication TypeJournal Article
Year of Publication2023
AuthorsHo, W. Ying, C. W. Johnson, T. Tak, M. Sauty, Y. Chao Chow, S. Nakamura, A. Schmid, J. Peretti, C. Weisbuch, and J. S. Speck
JournalApplied Physics Letters
Volume123
Issue3