Publications

Found 496 results
Author Title Type [ Year(Desc)]
Filters: Author is Speck, JS  [Clear All Filters]
2007
Koblmüller, G., CS. Gallinat, and JS. Speck, "Surface kinetics and thermal instability of N-face InN grown by plasma-assisted molecular beam epitaxy", Journal of applied physics, vol. 101, no. 8: AIP, pp. 083516, 2007.
Wu, Y., CG. Moe, S. Keller, SP. DenBaars, and JS. Speck, "Vertical defects in heavily Mg-doped Al0. 69Ga0. 31N", physica status solidi (a), vol. 204, no. 10: Wiley Online Library, pp. 3423–3428, 2007.
2008
Gorczyca, I., L. Dmowski, J. Plesiewicz, T. Suski, N. Egede Christensen, A. Svane, CS. Gallinat, G. Koblmueller, and JS. Speck, "Band structure and effective mass of InN under pressure", physica status solidi (b), vol. 245, no. 5: Wiley Online Library, pp. 887–889, 2008.
Armstrong, A., J. Caudill, A. Corrion, C. Poblenz, UK. Mishra, JS. Speck, and SA. Ringel, "Characterization of majority and minority carrier deep levels in p-type GaN: Mg grown by molecular beam epitaxy using deep level optical spectroscopy", Journal of Applied Physics, vol. 103, no. 6: AIP, pp. 063722, 2008.
Law, JJM., ET. Yu, BA. Haskell, PT. Fini, S. Nakamura, JS. Speck, and SP. DenBaars, "Characterization of nanoscale electronic structure in nonpolar GaN using scanning capacitance microscopy", Journal of Applied Physics, vol. 103, no. 1: AIP, pp. 014305, 2008.
Arehart, AR., A. Corrion, C. Poblenz, JS. Speck, UK. Mishra, SP. DenBaars, and SA. Ringel, "Comparison of deep level incorporation in ammonia and rf-plasma assisted molecular beam epitaxy n-GaN films", physica status solidi (c), vol. 5, no. 6: Wiley Online Library, pp. 1750–1752, 2008.
Arehart, AR., A. Corrion, C. Poblenz, JS. Speck, UK. Mishra, and SA. Ringel, "Deep level optical and thermal spectroscopy of traps in n-GaN grown by ammonia molecular beam epitaxy", Applied Physics Letters, vol. 93, no. 11: AIP, pp. 112101, 2008.
McGroddy, K., A. David, E. Matioli, M. Iza, S. Nakamura, S. DenBaars, JS. Speck, C. Weisbuch, and EL. Hu, "Directional emission control and increased light extraction in GaN photonic crystal light emitting diodes", Applied physics letters, vol. 93, no. 10: AIP, pp. 103502, 2008.
Gorczyca, I., J. Plesiewicz, L. Dmowski, T. Suski, N. Egede Christensen, A. Svane, CS. Gallinat, G. Koblmueller, and JS. Speck, "Electronic structure and effective masses of InN under pressure", Journal of Applied Physics, vol. 104, no. 1: AIP, pp. 013704, 2008.
King, PDC., TD. Veal, CS. Gallinat, G. Koblmüller, LR. Bailey, JS. Speck, and CF. McConville, "Influence of growth conditions and polarity on interface-related electron density in InN", Journal of Applied Physics, vol. 104, no. 10: AIP, pp. 103703, 2008.
Keller, S., CS. Suh, NA. Fichtenbaum, M. Furukawa, R. Chu, Z. Chen, K. Vijayraghavan, S. Rajan, SP. DenBaars, JS. Speck, et al., "Influence of the substrate misorientation on the properties of N-polar InGaN/GaN and AlGaN/GaN heterostructures", Journal of Applied Physics, vol. 104, no. 9: AIP, pp. 093510, 2008.
Chern-Metcalfe, GD., ED. Readinger, H. Shen, M. Wraback, G. Koblmüller, CS. Gallinat, and JS. Speck, "Intensity-dependent photoluminescence studies of the electric field in N-face and In-face InN/InGaN multiple quantum wells", physica status solidi (c), vol. 5, no. 6: Wiley Online Library, pp. 1846–1848, 2008.
Ive, T., T. Ben-Yaacov, A. Murai, H. Asamizu, CG. Van de Walle, U. Mishra, SP. DenBaars, and JS. Speck, "Metalorganic chemical vapor deposition of ZnO (0001) thin films on GaN (0001) templates and ZnO (0001) substrates", physica status solidi (c), vol. 5, no. 9: Wiley Online Library, pp. 3091–3094, 2008.
Koblmüller, G., A. Hirai, F. Wu, CS. Gallinat, GD. Metcalfe, H. Shen, M. Wraback, and JS. Speck, "Molecular beam epitaxy and structural anisotropy of m-plane InN grown on free-standing GaN", Applied Physics Letters, vol. 93, no. 17: AIP, pp. 171902, 2008.
Wraback, M., GA. Garrett, GD. Metcalfe, H. Shen, MC. Schmidt, A. Hirai, JS. Speck, SP. DenBaars, and S. Nakamura, Nonpolar Nitride Semiconductor Optoelectronic Devices: A Disruptive Technology for Next Generation Army Applications: DTIC Document, 2008.
Zhong, H., A. Tyagi, JS. Speck, and S. Nakamura, "Piezoelectric Field in Semi-Polar InGaN/GaN Quantum Wells H. Shen, GA Garrett, and M. Wraback US Army Research Laboratory 2800 Powder Mill Road, Adelphi, MD 20783", Phys. Lett, vol. 92, pp. 221110, 2008.
White, ME., MY. Tsai, F. Wu, and JS. Speck, "Plasma-assisted molecular beam epitaxy and characterization of Sn O 2 (101) on r-plane sapphire", Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 26, no. 5: AVS, pp. 1300–1307, 2008.
Tsai, MY., ME. White, and JS. Speck, "Plasma-assisted molecular beam epitaxy of SnO2 on TiO2", Journal of Crystal Growth, vol. 310, no. 18: North-Holland, pp. 4256–4261, 2008.
Keller, S., CS. Suh, Z. Chen, R. Chu, S. Rajan, NA. Fichtenbaum, M. Furukawa, SP. DenBaars, JS. Speck, and UK. Mishra, "Properties of N-polar AlGaN/GaN heterostructures and field effect transistors grown by metalorganic chemical vapor deposition", Journal of Applied Physics, vol. 103, no. 3: AIP, pp. 033708, 2008.
Ive, T., T. Ben-Yaacov, H. Asamizu, CG. Van de Walle, U. Mishra, SP. DenBaars, and JS. Speck, "Properties of ZnO (0001) layers grown by metalorganic chemical vapor deposition on GaN (0001) templates", physica status solidi (c), vol. 5, no. 6: Wiley Online Library, pp. 1733–1735, 2008.
Ive, T., T. Ben-Yaacov, CG. Van de Walle, UK. Mishra, SP. DenBaars, and JS. Speck, "Step-flow growth of ZnO (0 0 0 1) on GaN (0 0 0 1) by metalorganic chemical vapor epitaxy", Journal of Crystal Growth, vol. 310, no. 15: North-Holland, pp. 3407–3412, 2008.
Corrion, AL., C. Poblenz, F. Wu, and JS. Speck, "Structural and morphological properties of GaN buffer layers grown by ammonia molecular beam epitaxy on SiC substrates for AlGaN/GaN high electron mobility transistors", Journal of Applied Physics, vol. 103, no. 9: AIP, pp. 093529, 2008.
Choi, Y., M. Iza, E. Matioli, G. Koblmüller, JS. Speck, C. Weisbuch, and EL. Hu, "Submicron-thick microcavity InGaN light emitting diodes [6910-27]", PROCEEDINGS-SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, vol. 6910: International Society for Optical Engineering; 1999, pp. 6910, 2008.
Barabash, RI., G. E. Ice, BA. Haskell, S. Nakamura, JS. Speck, and W. Liu, "White X-ray microdiffraction analysis of defects, strain and tilts in a free standing GaN film", physica status solidi (b), vol. 245, no. 5: Wiley Online Library, pp. 899–902, 2008.
Pei, Y., C. Poblenz, AL. Corrion, R. Chu, L. Shen, JS. Speck, and UK. Mishra, "X-and Ka-band power performance of AlGaN/GaN HEMTs grown by ammonia-MBE", Electronics Letters, vol. 44, no. 9: IET, pp. 598–598, 2008.

Pages