| Title | White X-ray microdiffraction analysis of defects, strain and tilts in a free standing GaN film |
| Publication Type | Journal Article |
| Year of Publication | 2008 |
| Authors | Barabash, RI., G. E. Ice, BA. Haskell, S. Nakamura, JS. Speck, and W. Liu |
| Journal | physica status solidi (b) |
| Volume | 245 |
| Pagination | 899–902 |