| Title | Characterization of nanoscale electronic structure in nonpolar GaN using scanning capacitance microscopy |
| Publication Type | Journal Article |
| Year of Publication | 2008 |
| Authors | Law, JJM., ET. Yu, BA. Haskell, PT. Fini, S. Nakamura, JS. Speck, and SP. DenBaars |
| Journal | Journal of Applied Physics |
| Volume | 103 |
| Pagination | 014305 |