Publications

Found 631 results
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1986
Steinbeck, J., G. Braunstein, J. Speck, MS. Dresselhaus, CY. Huang, AM. Malvezzi, and N. Bloembergen, "Analysis of picosecond pulsed laser melted graphite", MRS Online Proceedings Library Archive, vol. 74: Cambridge University Press, 1986.
1987
Steinbeck, J., G. Braunstein, JS. Speck, MS. Dresselhaus, CY. Huang, M. Malvezzi, and N. Bloembergen, "Beam-Solid Interactions and Transient Processes", MRS Symposia Proceedings, Boston, edited by ST Picraux, MO Thompson and JS Williams,(Materials Research Society, 1986), vol. 74, pp. 263, 1987.
1995
Schueler, B. A., and X. Hu, "Correction of image intensifier distortion for three-dimensional x-ray angiography", Medical Imaging 1995: Physics of Medical Imaging, vol. 2432: International Society for Optics and Photonics, pp. 272–280, 1995.
Keller, BP., S. Keller, D. Kapolnek, WN. Jiang, YF. Wu, H. Masui, X. Wu, B. Heying, JS. Speck, UK. Mishra, et al., "Metalorganic chemical vapor deposition growth of high optical quality and high mobility GaN", Journal of electronic materials, vol. 24, no. 11: Springer-Verlag, pp. 1707–1709, 1995.
Zaremba, CM., AM. Belcher, M. Fritz, DE. Morse, JS. Speck, PK. Hansma, and GD. Stucky, "ORGANIC-INORGANIC INTERFACES IN THE ULTRASTRUCTURE OF RED ABALONE NACRE", ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, vol. 209: AMER CHEMICAL SOC PO BOX 57136, WASHINGTON, DC 20037-0136, pp. 584–INOR, 1995.
Kapolnek, D., XH. Wu, B. Heying, S. Keller, BP. Keller, UK. Mishra, SP. DenBaars, and JS. Speck, "Structural evolution in epitaxial metalorganic chemical vapor deposition grown GaN films on sapphire", Applied Physics Letters, vol. 67, no. 11: AIP, pp. 1541–1543, 1995.
1996
Sink, RK., S. Keller, BP. Keller, DI. Babić, AL. Holmes, D. Kapolnek, XH. Wu, JS. Speck, SP. DenBaars, and JE. Bowers, "Cleaved facets in GaN by wafer fusion of GaN to InP", MRS Online Proceedings Library Archive, vol. 421: Cambridge University Press, 1996.
Sink, RK., S. Keller, BP. Keller, D. I. Babić, AL. Holmes, D. Kapolnek, SP. DenBaars, JE. Bowers, XH. Wu, and JS. Speck, "Cleaved GaN facets by wafer fusion of GaN to InP", Applied physics letters, vol. 68, no. 15: AIP, pp. 2147–2149, 1996.
Zaremba, C. M., A. M. Belcher, M. Fritz, Y. Li, S. Mann, P. K. Hansma, D. E. Morse, J. S. Speck, and G. D. Stucky, "Critical transitions in the biofabrication of abalone shells and flat pearls", Chemistry of Materials, vol. 8, no. 3: American Chemical Society, pp. 679–690, 1996.
Keller, S., D. Kapolnek, B. P. Keller, Y. Wu, B. Heying, J. S. Speck, U. K. Mishra, and S. P. DenBaars, "Effect of the trimethylgallium flow during nucleation layer growth on the properties of GaN grown on sapphire", Japanese journal of applied physics, vol. 35, no. 3A: IOP Publishing, pp. L285, 1996.
Tarsa, EJ., EA. Hachfeld, FT. Quinlan, JS. Speck, and M. Eddy, "Growth-related stress and surface morphology in homoepitaxial SrTiO3 films", Applied physics letters, vol. 68, no. 4: AIP, pp. 490–492, 1996.
Chen, C-H., E. L. Hu, U. K. Mishra, J. P. Ibbetson, X. Wu, and J. S. Speck, "Improvement in low energy ion-induced damage with a low temperature GaAs capping layer", Applied physics letters, vol. 69, no. 12: AIP, pp. 1728–1730, 1996.
Keller, S., BP. Keller, Y-F. Wu, B. Heying, D. Kapolnek, JS. Speck, UK. Mishra, and SP. DenBaars, "Influence of sapphire nitridation on properties of gallium nitride grown by metalorganic chemical vapor deposition", Applied Physics Letters, vol. 68, no. 11: AIP, pp. 1525–1527, 1996.
Wu, XH., P. Fini, S. Keller, EJ. Tarsa, B. Heying, UK. Mishra, SP. DenBaars, and JS. Speck, "Morphological and structural transitions in GaN films grown on sapphire by metal-organic chemical vapor deposition", Japanese journal of applied physics, vol. 35, no. 12B: IOP Publishing, pp. L1648, 1996.
Wu, XH., D. Kapolnek, EJ. Tarsa, B. Heying, S. Keller, BP. Keller, UK. Mishra, SP. DenBaars, and JS. Speck, "Nucleation layer evolution in metal-organic chemical vapor deposition grown GaN", Applied physics letters, vol. 68, no. 10: AIP, pp. 1371–1373, 1996.
Lefevre, MJ., JS. Speck, RW. Schwartz, D. Dimos, SJ. Lockwood, H. Nagata, I. Sakamoto, H. Honda, J. Ichikawa, EM. Haga, et al., "Order No.: JA608-001\copyright 1996 MRS", MRS BULLETIN, 1996.
Lefevre, MJ., JS. Speck, RW. Schwartz, D. Dimos, SJ. Lockwood, H. Nagata, I. Sakamoto, H. Honda, J. Ichikawa, EM. Haga, et al., "Order No.: JA608-001\copyright 1996 MRS", MRS BULLETIN, 1996.
Heying, B., XH. Wu, S. Keller, Y. Li, D. Kapolnek, BP. Keller, S. P. DenBaars, and JS. Speck, "Role of threading dislocation structure on the x-ray diffraction peak widths in epitaxial GaN films", Applied physics letters, vol. 68, no. 5: AIP, pp. 643–645, 1996.
Heying, B., X. H. Wu, S. Keller, Y. Li, D. Kapolnek, B. P. Keller, S. P. DenBaars, and J. S. Speck, "Role of threading dislocation structure on the x‐ray diffraction peak widths in epitaxial GaN films", Applied Physics Letters, vol. 68, pp. 643-645, 1996.
1997
Schlom, DG., CB. Eom, ME. Hawley, CM. Foster, and JS. Speck, Epitaxial oxide thin films 3. Materials Research Society symposium proceedings Volume 474: Materials Research Society, Warrendale, PA (US), 1997.
Eom, C-B., C. Foster, ME. Hawley, D. Schlom, and JS. Speck, Epitaxial Oxide Thin Films III, vol. 474: Materials Research Society, 1997.
Tarsa, EJ., B. Heying, XH. Wu, P. Fini, SP. DenBaars, and JS. Speck, "Homoepitaxial growth of GaN under Ga-stable and N-stable conditions by plasma-assisted molecular beam epitaxy", Journal of applied physics, vol. 82, no. 11: AIP, pp. 5472–5479, 1997.
Docter, DP., JJ. Brown, M. Hu, M. Matloubian, J. Speck, X. Wu, and DE. Grider, "InzAl1- zAs/InyGa1- yAs lattice constant engineered HEMTs on GaAs", Solid-State Electronics, vol. 41, no. 10: Pergamon, pp. 1629–1634, 1997.
Sung, T., G. Popovici, MA. Prelas, RG. Wilson, SK. Loyalka, T. Lou, G. Fan, B. Ding, Z. Hu, AT. Chien, et al., "JMR Abstracts", MRS BULLETIN, pp. 85, 1997.
Mishra, U. K., P. Parikh, P. Chavarkar, J. Yen, J. Champlain, B. Thibeault, H. Reese, S. Stone Shi, E. Hu, L. Zhu, et al., "Oxide based compound semiconductor electronics", Electron Devices Meeting, 1997. IEDM'97. Technical Digest., International: IEEE, pp. 545–548, 1997.

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