| Title | Role of threading dislocation structure on the x-ray diffraction peak widths in epitaxial GaN films |
| Publication Type | Journal Article |
| Year of Publication | 1996 |
| Authors | Heying, B., XH. Wu, S. Keller, Y. Li, D. Kapolnek, BP. Keller, S. P. DenBaars, and JS. Speck |
| Journal | Applied physics letters |
| Volume | 68 |
| Pagination | 643–645 |