| Title | Role of threading dislocation structure on the x‐ray diffraction peak widths in epitaxial GaN films |
| Publication Type | Journal Article |
| Year of Publication | 1996 |
| Authors | Heying, B., X. H. Wu, S. Keller, Y. Li, D. Kapolnek, B. P. Keller, S. P. DenBaars, and J. S. Speck |
| Journal | Applied Physics Letters |
| Volume | 68 |
| Pagination | 643-645 |
| URL | https://doi.org/10.1063/1.116495 |
| DOI | 10.1063/1.116495 |