Publications

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1999
Fini, P. T., J. P. Ibbetson, H. Marchand, L. Zhao, S. P. DenBaars, and J. S. Speck, "Measurement of crystallographic tilt in the lateral epitaxial overgrowth of GaN", Journal of Electronic Materials, vol. 28, no. 7: The Metals, Minerals, and Materials Society, pp. 1044, 1999.