| Title | Measurement of crystallographic tilt in the lateral epitaxial overgrowth of GaN |
| Publication Type | Journal Article |
| Year of Publication | 1999 |
| Authors | Fini, P. T., J. P. Ibbetson, H. Marchand, L. Zhao, S. P. DenBaars, and J. S. Speck |
| Journal | Journal of Electronic Materials |
| Volume | 28 |
| Pagination | 1044 |