Publications

Found 6 results
Author Title Type [ Year(Asc)]
Filters: Author is De Graef, Marc  [Clear All Filters]
2023
Wang, Fulin, Jean-Charles Stinville, Marie Charpagne, McLean P. Echlin, Sean R. Agnew, Tresa M. Pollock, Marc De Graef, and Daniel S. Gianola. "Dislocation cells in additively manufactured metallic alloys characterized by electron backscatter diffraction pattern sharpness." Materials Characterization (2023): 112673.
Meynell, Simon A., Yolita M. Eggeler, Joshua D. Bocarsly, Daniil A. Kitchaev, Bailey E. Rhodes, Tresa M. Pollock, Stephen D. Wilson, Anton Van der Ven, Ram Seshadri, Marc De Graef et al. "Inducing skyrmion flop transitions in Co 8 Zn 8 Mn 4 at room temperature." Physical Review Materials 7 (2023): 044401.
2021
Wang, Fulin, McLean P. Echlin, Aidan A. Taylor, Jungho Shin, Benjamin Bammes, Barnaby DA Levin, Marc De Graef, Tresa M. Pollock, and Daniel S. Gianola. "Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition." Ultramicroscopy 220 (2021): 113160.
2020
Wang, Fulin, McLean Echlin, Jungho Shin, Benjamin Bammes, Marc De Graef, Tresa Pollock, and Daniel Gianola. "Opportunities for Electron Backscattered Diffraction Enabled by Direct Electron Detection." Microscopy and Microanalysis 26 (2020): 1164-1165.
2018
Callahan, Patrick, Jean-Charles Stinville, Eric Yao, McLean P. Echlin, Jungho Shin, Fulin Wang, Marc De Graef, Tresa M. Pollock, and Daniel S. Gianola. "Defect Characterization using Transmission Scanning Electron Microscopy." Microscopy and Microanalysis 24 (2018): 1836-1837.
Callahan, Patrick G., Jean-Charles Stinville, Eric R. Yao, McLean P. Echlin, Michael S. Titus, Marc De Graef, Daniel S. Gianola, and Tresa M. Pollock. "Transmission scanning electron microscopy: Defect observations and image simulations." Ultramicroscopy 186 (2018): 49-61.