| Title | Defect Characterization using Transmission Scanning Electron Microscopy |
| Publication Type | Journal Article |
| Year of Publication | 2018 |
| Authors | Callahan, Patrick, Jean-Charles Stinville, Eric Yao, McLean P. Echlin, Jungho Shin, Fulin Wang, Marc De Graef, Tresa M. Pollock, and Daniel S. Gianola |
| Journal | Microscopy and Microanalysis |
| Volume | 24 |
| Pagination | 1836–1837 |