Publications

Found 6 results
Author Title Type [ Year(Asc)]
Filters: Author is Echlin, McLean P  [Clear All Filters]
2023
Wang, Fulin, Jean-Charles Stinville, Marie Charpagne, McLean P. Echlin, Sean R. Agnew, Tresa M. Pollock, Marc De Graef, and Daniel S. Gianola. "Dislocation cells in additively manufactured metallic alloys characterized by electron backscatter diffraction pattern sharpness." Materials Characterization (2023): 112673.
2021
Wang, Fulin, McLean P. Echlin, Aidan A. Taylor, Jungho Shin, Benjamin Bammes, Barnaby DA Levin, Marc De Graef, Tresa M. Pollock, and Daniel S. Gianola. "Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition." Ultramicroscopy 220 (2021): 113160.
2019
Stinville, JC, Eric R. Yao, Patrick G. Callahan, Jungho Shin, Fulin Wang, McLean P. Echlin, Tresa M. Pollock, and Daniel S. Gianola. "Dislocation dynamics in a nickel-based superalloy via in-situ transmission scanning electron microscopy." Acta Materialia 168 (2019): 152-166.
2018
Callahan, Patrick, Jean-Charles Stinville, Eric Yao, McLean P. Echlin, Jungho Shin, Fulin Wang, Marc De Graef, Tresa M. Pollock, and Daniel S. Gianola. "Defect Characterization using Transmission Scanning Electron Microscopy." Microscopy and Microanalysis 24 (2018): 1836-1837.
Balbus, Glenn H., McLean P. Echlin, Charlette M. Grigorian, Timothy J. Rupert, Tresa M. Pollock, and Daniel S. Gianola. "Femtosecond laser rejuvenation of nanocrystalline metals." Acta Materialia 156 (2018): 183-195.
Callahan, Patrick G., Jean-Charles Stinville, Eric R. Yao, McLean P. Echlin, Michael S. Titus, Marc De Graef, Daniel S. Gianola, and Tresa M. Pollock. "Transmission scanning electron microscopy: Defect observations and image simulations." Ultramicroscopy 186 (2018): 49-61.