Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition

TitleElectron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition
Publication TypeJournal Article
Year of Publication2021
AuthorsWang, Fulin, McLean P. Echlin, Aidan A. Taylor, Jungho Shin, Benjamin Bammes, Barnaby DA Levin, Marc De Graef, Tresa M. Pollock, and Daniel S. Gianola
JournalUltramicroscopy
Volume220
Pagination113160