| Title | Transmission scanning electron microscopy: Defect observations and image simulations |
| Publication Type | Journal Article |
| Year of Publication | 2018 |
| Authors | Callahan, Patrick G., Jean-Charles Stinville, Eric R. Yao, McLean P. Echlin, Michael S. Titus, Marc De Graef, Daniel S. Gianola, and Tresa M. Pollock |
| Journal | Ultramicroscopy |
| Volume | 186 |
| Pagination | 49–61 |