Title | Opportunities for Electron Backscattered Diffraction Enabled by Direct Electron Detection |
Publication Type | Journal Article |
Year of Publication | 2020 |
Authors | Wang, Fulin, McLean Echlin, Jungho Shin, Benjamin Bammes, Marc De Graef, Tresa Pollock, and Daniel Gianola |
Journal | Microscopy and Microanalysis |
Volume | 26 |
Pagination | 1164–1165 |