| Title | Opportunities for Electron Backscattered Diffraction Enabled by Direct Electron Detection |
| Publication Type | Journal Article |
| Year of Publication | 2020 |
| Authors | Wang, Fulin, McLean Echlin, Jungho Shin, Benjamin Bammes, Marc De Graef, Tresa Pollock, and Daniel Gianola |
| Journal | Microscopy and Microanalysis |
| Volume | 26 |
| Pagination | 1164–1165 |