Opportunities for Electron Backscattered Diffraction Enabled by Direct Electron Detection

TitleOpportunities for Electron Backscattered Diffraction Enabled by Direct Electron Detection
Publication TypeJournal Article
Year of Publication2020
AuthorsWang, Fulin, McLean Echlin, Jungho Shin, Benjamin Bammes, Marc De Graef, Tresa Pollock, and Daniel Gianola
JournalMicroscopy and Microanalysis
Volume26
Pagination1164–1165