Publications
Found 2 results
Author Title Type [ Year
Filters: Keyword is Temperature measurement [Clear All Filters]
"Multiple Defects Cause Degradation After High Field Stress in AlGaN/GaN HEMTs", IEEE Transactions on Device and Materials Reliability, vol. 18, pp. 364-376, Sept, 2018.
, "Impact of p-GaN Thermal Damage and Barrier Composition on Semipolar Green Laser Diodes", IEEE Photonics Technology Letters, vol. 26, pp. 43-46, Jan, 2014.
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