Publications

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2015
Papadogianni, A., M. E. White, J. S. Speck, Z. Galazka, and O. Bierwagen, "Hall and Seebeck measurements estimate the thickness of a (buried) carrier system: Identifying interface electrons in In-doped SnO2 films", Applied Physics Letters, vol. 107, no. 25: AIP Publishing, pp. 252105, 2015.