| Title | Hall and Seebeck measurements estimate the thickness of a (buried) carrier system: Identifying interface electrons in In-doped SnO2 films |
| Publication Type | Journal Article |
| Year of Publication | 2015 |
| Authors | Papadogianni, A., M. E. White, J. S. Speck, Z. Galazka, and O. Bierwagen |
| Journal | Applied Physics Letters |
| Volume | 107 |
| Pagination | 252105 |