Modeling and analysis for thermal management in gallium oxide field-effect transistors

TitleModeling and analysis for thermal management in gallium oxide field-effect transistors
Publication TypeJournal Article
Year of Publication2020
AuthorsYuan, C., Y. Zhang, R. Montgomery, S. Kim, J. Shi, A. Mauze, T. Itoh, J. S. Speck, and S. Graham
JournalJournal of Applied Physics
Volume127
Pagination154502
URLhttps://doi.org/10.1063/1.5141332
DOI10.1063/1.5141332