Publications

Found 14 results
Author Title Type [ Year(Asc)]
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2023
Wang, Fulin, Jean-Charles Stinville, Marie Charpagne, McLean P. Echlin, Sean R. Agnew, Tresa M. Pollock, Marc De Graef, and Daniel S. Gianola. "Dislocation cells in additively manufactured metallic alloys characterized by electron backscatter diffraction pattern sharpness." Materials Characterization (2023): 112673.
Meynell, Simon A., Yolita M. Eggeler, Joshua D. Bocarsly, Daniil A. Kitchaev, Bailey E. Rhodes, Tresa M. Pollock, Stephen D. Wilson, Anton Van der Ven, Ram Seshadri, Marc De Graef et al. "Inducing skyrmion flop transitions in Co 8 Zn 8 Mn 4 at room temperature." Physical Review Materials 7 (2023): 044401.
2021
Wong, Matthew S., Drew Melchert, Michael Haggmark, Daniel Myers, Changmin Lee, Srinivas Grandrothula, Mattanjah de Vries, Daniel Gianola, Matthew Begley, Tal Magarlith et al. "Acousto-fluidic assembly of III-nitride micro-light-emitting diodes with magnetic alignment." In Light-Emitting Devices, Materials, and Applications XXV. International Society for Optics and Photonics, 2021.
Wang, Fulin, McLean P. Echlin, Aidan A. Taylor, Jungho Shin, Benjamin Bammes, Barnaby DA Levin, Marc De Graef, Tresa M. Pollock, and Daniel S. Gianola. "Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition." Ultramicroscopy 220 (2021): 113160.
Wang, Fulin, McLean P. Echlin, Aidan A. Taylor, Jungho Shin, Benjamin Bammes, Barnaby DA Levin, Marc De Graef, Tresa M. Pollock, and Daniel S. Gianola. "Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition." Ultramicroscopy 220 (2021): 113160.
2020
Wang, Fulin, McLean Echlin, Jungho Shin, Benjamin Bammes, Marc De Graef, Tresa Pollock, and Daniel Gianola. "Opportunities for Electron Backscattered Diffraction Enabled by Direct Electron Detection." Microscopy and Microanalysis 26 (2020): 1164-1165.
2019
Melchert, Drew S., Rachel R. Collino, Tyler R. Ray, Neil D. Dolinski, Leanne Friedrich, Matthew R. Begley, and Daniel S. Gianola. "Flexible conductive composites with programmed electrical anisotropy using acoustophoresis." Advanced Materials Technologies 4 (2019): 1900586.
2018
Callahan, Patrick, Jean-Charles Stinville, Eric Yao, McLean P. Echlin, Jungho Shin, Fulin Wang, Marc De Graef, Tresa M. Pollock, and Daniel S. Gianola. "Defect Characterization using Transmission Scanning Electron Microscopy." Microscopy and Microanalysis 24 (2018): 1836-1837.
Callahan, Patrick G., Jean-Charles Stinville, Eric R. Yao, McLean P. Echlin, Michael S. Titus, Marc De Graef, Daniel S. Gianola, and Tresa M. Pollock. "Transmission scanning electron microscopy: Defect observations and image simulations." Ultramicroscopy 186 (2018): 49-61.
2017
Cubuk, Ekin Dogus, RJS Ivancic, Samuel S. Schoenholz, DJ Strickland, Anindita Basu, ZS Davidson, Julien Fontaine, Jyo Lyn Hor, Y-R Huang, Y Jiang et al. "Structure-property relationships from universal signatures of plasticity in disordered solids." Science 358 (2017): 1033-1037.
2015
X. Zhao, D.J. Strickland, P.M. Derlet, M.R. He, Y.J. Cheng, J. Pu, K. Hattar, and D.S. Gianola. "In situ measurements of a homogeneous to heterogeneous transition in the plastic response of ion-irradiated< 111> Ni microspecimens." Acta Materialia 88 (2015): 121-135. (5.12 MB)
2014
M.R. He, P.J. Felfer, S. Dasgupta, S.K. Samudrala, P.J. Malone, G. Feng, K.J. Hemker, J.M. Cairney, and D.S. Gianola. "Understanding the mechanical behavior of nanocrystalline Al–O thin films with complex microstructures." Acta Materialia 77 (2014): 269-283. (4.15 MB)
2013
D.S. Gianola, Z. Lee, C. Ophus, E.J. Luber, D. Mitlin, U. Dahmen, K.J. Hemker, and V.R. Radmilović. "Tensile behavior of Al1-xMox crystalline and amorphous thin films." Acta Materialia 61 (2013): 1432-1443. (1.27 MB)
2012
F. Mompiou, M. Legros, T. Radetic, U. Dahmen, D.S. Gianola, and K.J.Hemker. "In situ TEM observation of grain annihilation in tricrystalline aluminum films." Acta Materialia 60 (2012): 2209-2218. (1.67 MB)