Publications

Found 2 results
Author Title Type [ Year(Asc)]
Filters: Keyword is Temperature  [Clear All Filters]
2018
Jiang, R., X. Shen, J. Fang, P. Wang, E. X. Zhang, J. Chen, D. M. Fleetwood, R. D. Schrimpf, S. W. Kaun, E. C. H. Kyle, et al., "Multiple Defects Cause Degradation After High Field Stress in AlGaN/GaN HEMTs", IEEE Transactions on Device and Materials Reliability, vol. 18, pp. 364-376, Sept, 2018.
2002
Acikel, B., T. R. Taylor, P. J. Hansen, J. S. Speck, and R. A. York, "A new X-band 180º high performance phase shifter using (BaSr)TiO3 thin films", 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278), June, 2002.