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2007
Chakraborty, A., C. G. Moe, Y. Wu, T. Mates, S. Keller, J. S. Speck, S. P. DenBaars, and U. K. Mishra, "Electrical and structural characterization of Mg-doped p-type Al 0.69 Ga 0.31 N films on SiC substrate", Journal of Applied Physics, vol. 101, no. 5: AIP, pp. 053717, 2007.