Electrical and structural characterization of Mg-doped p-type Al 0.69 Ga 0.31 N films on SiC substrate

TitleElectrical and structural characterization of Mg-doped p-type Al 0.69 Ga 0.31 N films on SiC substrate
Publication TypeJournal Article
Year of Publication2007
AuthorsChakraborty, A., C. G. Moe, Y. Wu, T. Mates, S. Keller, J. S. Speck, S. P. DenBaars, and U. K. Mishra
JournalJournal of Applied Physics
Volume101
Pagination053717