Publications

Found 5 results
Author Title Type [ Year(Desc)]
Filters: Author is Veal, TD  [Clear All Filters]
2008
King, PDC., TD. Veal, CS. Gallinat, G. Koblmüller, LR. Bailey, JS. Speck, and CF. McConville, "Influence of growth conditions and polarity on interface-related electron density in InN", Journal of Applied Physics, vol. 104, no. 10: AIP, pp. 103703, 2008.
2010
Rauch, C., F. Reurings, F. Tuomisto, TD. Veal, C. F. McConville, H. Lu, WJ. Schaff, CS. Gallinat, G. Koblmüller, JS. Speck, et al., "In-vacancies in Si-doped InN", physica status solidi (a), vol. 207, no. 5: WILEY-VCH Verlag, pp. 1083–1086, 2010.
Linhart, WM., TD. Veal, PDC. King, G. Koblmüller, CS. Gallinat, JS. Speck, and CF. McConville, "Surface, bulk, and interface electronic properties of nonpolar InN", Applied Physics Letters, vol. 97, no. 11: AIP, pp. 112103, 2010.
2012
Farahani, SK. Vasheghani, TD. Veal, AM. Sanchez, O. Bierwagen, ME. White, S. Gorfman, PA. Thomas, JS. Speck, and CF. McConville, "Influence of charged-dislocation density variations on carrier mobility in heteroepitaxial semiconductors: The case of SnO 2 on sapphire", Physical Review B, vol. 86, no. 24: American Physical Society, pp. 245315, 2012.
2014
Farahani, SK. Vasheghani, TD. Veal, JJ. Mudd, DO. Scanlon, GW. Watson, O. Bierwagen, ME. White, JS. Speck, and CF. McConville, "Valence-band density of states and surface electron accumulation in epitaxial SnO 2 films", Physical Review B, vol. 90, no. 15: American Physical Society, pp. 155413, 2014.