Origin of reduced efficiency in GaN-based micro-LEDs studied by scanning near-field optical microscopy

TitleOrigin of reduced efficiency in GaN-based micro-LEDs studied by scanning near-field optical microscopy
Publication TypeJournal Article
Year of Publication2025
AuthorsYapparov, R., M. S. Wong, T. Tak, S. P. DenBaars, J. S. Speck, and S. Marcinkevičius
JournalApplied Physics Letters
Volume126