| Title | Measurement of minority carrier diffusion length in p-GaN using electron emission spectroscopy (EES) |
| Publication Type | Journal Article |
| Year of Publication | 2023 |
| Authors | Ho, W. Ying, Y. Chao Chow, S. Nakamura, J. Peretti, C. Weisbuch, and J. S. Speck |
| Journal | Applied Physics Letters |
| Volume | 122 |
| Start Page | 212103 |